Surface potential studies using Kelvin force spectroscopy

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Lu J ^a   Guggisberg, M ^a   Luthi R ^a   Kubon, M ^a   Scandella, L ^b   Gerber, Ch ^c   Meyer, E ^a   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT POTENTIAL DIFFERENCE; KELVIN FORCE; KELVIN FORCE MICROSCOPES; LOCAL MEASUREMENT; NONCONTACT ATOMIC FORCE MICROSCOPY; SAMS; SELF-ASSEMBLING MONOLAYERS; SIMPLE MODIFICATIONS; SPECTROSCOPIC METHOD;

ATOMIC FORCE MICROSCOPY; MONOLAYERS;

SPECTROSCOPIC ANALYSIS;

EID: 0001260473     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051144     Document Type: Article

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