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Volumn 66, Issue SUPPL. 1, 1998, Pages

Surface potential studies using Kelvin force spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT POTENTIAL DIFFERENCE; KELVIN FORCE; KELVIN FORCE MICROSCOPES; LOCAL MEASUREMENT; NONCONTACT ATOMIC FORCE MICROSCOPY; SAMS; SELF-ASSEMBLING MONOLAYERS; SIMPLE MODIFICATIONS; SPECTROSCOPIC METHOD;

EID: 0001260473     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051144     Document Type: Article
Times cited : (15)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.