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Volumn 66, Issue SUPPL. 1, 1998, Pages
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Surface potential studies using Kelvin force spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTACT POTENTIAL DIFFERENCE;
KELVIN FORCE;
KELVIN FORCE MICROSCOPES;
LOCAL MEASUREMENT;
NONCONTACT ATOMIC FORCE MICROSCOPY;
SAMS;
SELF-ASSEMBLING MONOLAYERS;
SIMPLE MODIFICATIONS;
SPECTROSCOPIC METHOD;
ATOMIC FORCE MICROSCOPY;
MONOLAYERS;
SPECTROSCOPIC ANALYSIS;
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EID: 0001260473
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s003390051144 Document Type: Article |
Times cited : (15)
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References (11)
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