Toward a force spectroscopy of polymer surfaces

Langmuir

Volumn 14, Issue 2, 1998, Pages 372-378

  Feldman, Kirill ^a   Tervoort, Theo ^a   Smith, Paul ^a   Spencer, Nicholas D ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; FLUORINE COMPOUNDS; FORCE MEASUREMENT; FRICTION; IMAGING TECHNIQUES; POLYMER BLENDS; PROBES; SURFACE PHENOMENA; VAN DER WAALS FORCES;

LIFSHITZ THEORY;

PLASTIC FILMS;

EID: 0031646940     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9703353     Document Type: Article

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