Comparative atomic force microscopy study of the chain length dependence of frictional properties of alkanethiols on gold and alkylsilanes on Mica

Journal of Physical Chemistry B

Volumn 101, Issue 19, 1997, Pages 3800-3805

  Lio, A ^a,b   Charych, D H ^a   Salmeron, M ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000766349     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp963918e     Document Type: Article

References (43)

1. Bowden, F. P.; Tabor, D. The Friction and Lubrication of Solids; Clarendon Press: Oxford, 1986.
2. Suzuki, M.; Saotome, Y.; Yanagisawa, M. Thin Solid Films 1988, 160, 453.
3. Miyamoto, T.; Sato, I.; Ando, Y. In Tribology and Mechanics of Magnetic Storage Devices, 2nd ed.; Bhusnan, B., Eiss, N. S., Eds.; Springer-Verlag: New York, 1990.
4. Ando, E.; Goto, Y.; Morimoto, K.; Ariga. K.; Okahata, Y. Thin Solid Films 1989, 180, 287.
5. Bhushan, B.; Gupta, B. K. Handbook of Tribology: Materials, Coatings anil Surface Treatments; McGraw-Hill: New York, 1991.
6. Ruhe, J.; Novotny, V. J.; Kanazawa, K. K.; Clarke, T.; Street, G. B. Langmuir 1993, 9, 2383.
7. Zarrad, H.; Clechet, P.; Belin, M.; Marteler, C.; Jaffrezic-Renault, N. J. Micromech. Microeng. 1993, 3, 222.
8. Bhushan, B.; Koinkar, V. N. J. Appl. Phys. 1994, 75, 5741.
9. Bhushan, B.; Kulkarni, A. V.; Koinkar, V. N.; Boehm, M.; Odoni, L.; Martelet, C.; Belin, M. Langmuir 1995, 11, 3189.
10. Overney, R. M.; Meyer, E.; Frommer, J.; Gümherodt, H.-J. Langmuir 1994, 10, 1281.
11. Takano, H.; Fujihira, M. J. Vac. Sci. Technol. B 1996, 14, 1272.
12. Fujihara, M.; Morita, Y. J. Vac. Sci. Technol. B 1994, 12, 1609.
13. Levine, O.; Zisman, W. A. 1957, 61, 1068 and references therein.
14. Xiao, X.-d.; Hu. J.; Charych, D. H.; Salmeron, M. Langmuir 1996, 12, 235.
15. Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evail, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321.
16. Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559.
17. Strong, L.; Whitesides, G. M. Langmuir 1988, 4, 546.
18. Chidsey, C. E. D.; Liu, G.-y.; Rowntree, P.; Scoles, G. J. J. Chem. Phys. 1989, 91, 4421.
19. Camillone, N.; Chidsey, C. E. D.; Liu, G.-y.; Putvinski, T. M.; Scoles, G. J. J. Chem. Phys. 1991, 94, 8493.
20. Dubois, L. H.; Zegarski, B. R.; Nuzzo, R. G. J. Chem. Phys. 1993, 98, 678.
21. Camillone, N.; Chidsey, C. E. D.; Liu, G.-y.; Scoles, G. J. J. Chem. Phys. 1993, 98, 3503.
22. Poirier, G. E.; Tarlov, M. J. Langmuir 1994, 10, 2853.
23. Anselmetti, D.; Baratoff, A.; Güntherodt, H.-J.; Delamarche, E.; Michel, B.; Gerber, C.; Kank, H.; Wolf, H.; Ringsdorf, H. Europhys. Lett. 1994, 27, 365.
24. Fenter, P.; Eisenberger, P.; Liang, K. S. Phys. Rev. Lett. 1993, 70, 2447.
25. Fenter, P.; Eberhardt, A.; Eisenberger, P. Science 1994, 266, 1216.
26. Poirier, G. E.; Tarlov, M. J.; Rushmeier, H. E. Langmuir 1994, 10, 3383.
27. Ulman, A. Introduction to Ultrathin Organic Films: From Langmuir-Blodgett to Self-Assembly; Academic Press: San Diego, CA, 1991.
28. Peanasky, J.; Schneider, H. M.; Granick, S.; Kessel, C. R. Langmuir 1995, 11, 953.
29. Tidswell, I. M.; Rabedeau, T. A.; Pershan, P. S.; Kosowsky, S. D.; Folkers, J. P.; Whitesides, G. M. J. Chem. Phys. 1991, 95, 2854.
30. Xiao, X.-d.; Liu, G.-y.; Charych, D. H.; Salmeron, M. Langmuir 1995, 11, 1600.
31. Hoffman, H.; Mayer, U.; Krischanitz, A. Langmuir 1995, 11, 1304.
32. Wasserman, S. R.; Tao, Y.-T.; Whitesides, G. M. Langmuir 1989, 5, 1074.
33. Kolbe, W. F.; Ogletree, D. F.; Salmeron, M. Ultramicroscopy 1992, 42-44, 369.
34. Lio, A.; Morant, C.; Ogletree, D. F.; Salmeron, M. J. Phys. Chem. in press.
35. Mate, C. M.; McClelland, G. M.; Elandsson, R.; Chiang, S. Phys. Rev. Lett. 1987, 59, 1942.
36. Ogletree, D. F.; Carpick, R. W.; Salmeron, M. Rev. Sci. Instrum. 1996, 67, 3298.
37. Sader, J. E.; Larson, I.; Mulvaney, P.; White, L. R. Rev. Sci. Instrum. 1995, 66, 3789.
38. Liu, G.-y.; Salmeron, M. Langmuir 1994, 10, 367.
39. Du, Q.; Xiao, X.-d.; Charych, D. H.; Wolf, F.; Frantz, P.; Ogletree, D. F.; Shen, Y. R.; Salmeron, M. Phys. Rev. B 1995, 51, 7456.
40. Hertz, H. J. Reine Angew. Math. 1882, 92, 156.
41. Koleske, D. D.; Barger, W. R.; Lee, G. U.; Colton, R. Thin Solid Films, in press.
42. Thiol data from Aldrich Chemical Company.
43. 36 significantly differs from the nominal value of 0.58 N/m provided by the manufacturer. However, the value reported in this paper is in agreement with the experimentally determined one for similar levers with resonance frequencies similar to the one observed in this study (52 kHz). See: Cleveland, J. P.; Manne, S.; Bocek, D.; Hansma, P. K. Rev. Sci. Instrum. 1993, 64, 403.