Solvent exclusion and chemical constrast in scanning force microscopy

Journal of the American Chemical Society

Volumn 118, Issue 37, 1996, Pages 8925-8931

  Sinniah, S K ^a   Steel, A B ^b   Miller, C J ^b   Reutt Robey, J E ^b  

^a CALVIN COLLEGE   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; SCANNING FORCE MICROSCOPY; TECHNIQUE;

EID: 0029834220     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja961295c     Document Type: Article

References (26)

1. Frisbie, C. D.; Rozsnyai, L. F.; Noy, A.; Wrighton, M. S.; Lieber, C. Science 1994, 265, 2071-2074.
2. Noy, A.; Frisbie, C. D.; Rozsnyai, L. F.; Wrighton, M. S.; Lieber, C. M. J. Am. Chem. Soc. 1995, 117, 7943-7951.
3. Green, J.-B. D.; McDermott, M. T.; Porter, M. D.; Siperko, L. M. J. Phys. Chem. 1995, 99, 10960-10965.
4. Berger, C. E. H.; van der Werf, K. O.; Kooyman, R. P. H.; de Grooth, B. G.; and Greve, J. Langmuir 1995, 11, 4188-4192.
5. Akari, S.; Schrepp, W.; Horn, D. Langmuir 1996, 21, 857-860.
6. Overney, R. M.; Meyer, E.; Frommer, J.; Guntherodt, H.-J.; Fujihara, M.; Takano, H.; Gotoh, Y. Nature 1992, 359, 133-135.
7. Ovemey, R. M.; Meyer, E.; Frommer, J.; Guntherodt, H.-J.; Fujihara, M.; Takano, H.; Gotoh, Y. Langmuir 1994 10, 1281-1286.
8. Wilbur, J. L.; Biebuyck, H. A.; MacDonald, J. C.; Whitesides, G. M. Langmuir 1995, 11, 825-831.
9. Koléske, D. D.; Barger, W. R.; Lee, G. U.; Colton, R. J. Langmuir 1996, in press.
10. Weisenhorn, A. L.; Maivald, P.; Butt, H.-J.; Hansma, P. K. Phys. Rev. B 1992, 45, 11226-11232.
11. Although we cannot exclude the mechanical component of the adhesive forces, we have utilized a series of chemically modified SAMS with the same nominal hydrocarbon chain length. Consequently, observed differences should primarily reflect the chemical differences in chain termination.
12. Bain, C. D.; Whitesides, G. M. Angew. Chem. Int. Ed. Engl. 1989, 28, 506-512.
13. Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321-335.
14. Bain, C. D.; Evall, J.; Whitesides, G. M. J. Am. Chem. Soc. 1989, 111, 7155-7164.
15. Becka, A.; Miller, C. J. J. Phys. Chem. 1992, 96, 2657.
16. Salmeron, M.; Liu, G.-y.; Ogletree, D. F. Forces in Scanning Probe Methods; H.-J. Guntherodt, et al., Eds.; Kluwer Academic Publishers: Netherlands. 1995; 593-598.
17. Sader, J. E.; Larson, I.; Mulvaney, P.; White, L. R. Rev. Sci. Inst. 1995, 66, 3789-3798.
18. Cleveland, J. P.; Manne, S.; Bocek, D.; Hansma, P. K. Rev. Sci. Inst. 1993, 64, 403-405.
19. Israelachvili, J. Intermolecular and Surface Forces; 2nd ed.; Academic Press Limited: San Diego, 1994.
20. Jasper, J. J. J. Phys. Chem. Ref. Data 1972, 1, 841.
21. Chaudhury, M. K.; Whitesides, G. M. Science 1992, 255, 1230-1232.
22. Thomas, R. C.; Houston, J. E.; Crooks, R. M.; Kim, T.; Michalske, T. A. J. Am. Chem. Soc. 1995, 117, 3839-3834.
23. Johnson, K. L.; Kendall, K.; Roberts, A. D. Proc. R. Soc. London, A 1971, 324, 301.
24. 10 chains employed in this study, leading to structural (and hydrogen-bonding) differences between the monolayer surfaces. These differences could also reflect different water content in the ethanol solvent.
25. van der Werf, K. O.; Putman, C. A. J.; de Grooth, B. G.; Greve, J. App. Phys. Lett. 1994, 65, 1195-1197.
26. Binggeli, M.; Mate, C. M. J. Vac. Sci. Tech. B 1995, 13, 1312-1315.