Solvent exclusion and chemical constrast in scanning force microscopy

Journal of the American Chemical Society

Volumn 118, Issue 37, 1996, Pages 8925-8931

  Sinniah, S K ^a   Steel, A B ^b   Miller, C J ^b   Reutt Robey, J E ^b  

^a CALVIN COLLEGE   (United States)

^b Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; SCANNING FORCE MICROSCOPY; TECHNIQUE;

EID: 0029834220     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja961295c     Document Type: Article

References (26)

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