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Volumn 13, Issue 4, 1997, Pages 293-296
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Force titration of self-assembled monolayer using chemical force microscopy
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Author keywords
Adhesion force; Chemical force microscopy (CFM); Force titration; Self assembled monolayer (SAM)
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Indexed keywords
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EID: 0031321507
PISSN: 10006818
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (11)
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References (7)
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