Force titration of self-assembled monolayer using chemical force microscopy

Acta Physico - Chimica Sinica

Volumn 13, Issue 4, 1997, Pages 293-296

  He, Huixin ^a   Li, Chunzeng ^a   Wang, Junmei ^a   Zhang, Haoli ^a   Xu, Xiaojie ^a   Liu, Zhongfan ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

Adhesion force; Chemical force microscopy (CFM); Force titration; Self assembled monolayer (SAM)

Indexed keywords

EID: 0031321507     PISSN: 10006818     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. Frisbie C D, Rozsnyai L F, Lieber C M, et al. Science., 1994, 265:2071
2. Noy A, Frisbie C D, Lieber C M, et al. J. Am. Chem. Soc., 1995, 117:7943
3. Akari S, Horn D, Keller H, Schrepp W. Adv. Mater., 1995, 7:549
4. Green J-B D, McDermott M T, Porter M D. J. Phys. Chem., 1995, 99:10960
5. Han T, Williams J M, Beebe T P Jr. Anal. Chim. Acta., 1995, 307:365
6. Greager S E, Clarke J. Langmuir, 1994, 10:3675
7. Chen Y L, Hehn C A, Israclachvili J N. J. Phys. Chem., 1991, 95:10736