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Volumn 13, Issue 4, 1997, Pages 293-296

Force titration of self-assembled monolayer using chemical force microscopy

Author keywords

Adhesion force; Chemical force microscopy (CFM); Force titration; Self assembled monolayer (SAM)

Indexed keywords


EID: 0031321507     PISSN: 10006818     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (11)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.