Monitoring Multilayer Film Growth with the Atomic Force Microscope. Aluminum(III) Alkanebisphosphonate Multilayer Films and DNA Immobilization

Analytical Chemistry

Volumn 70, Issue 14, 1998, Pages 2870-2875

  Hu, Kai ^a   Pyati, Radha ^a,b   Bard, Allen J ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001573506     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac980145c     Document Type: Article

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