The application of force microscopy to immunodiagnostic systems: Imaging and biomolecular adhesion measurements

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Allen, S ^a   Chen, X ^a   Davies, J ^b   Davies, M C ^a   Dawkes, A C ^b   Edwards, J C ^b   Roberts, C J ^a   Tendler, S J B ^a   Williams, P M ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b JOHNSON AND JOHNSON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION MEASUREMENT; AFM; AFM PROBE; ANALYTES; ANTIBODY MOLECULES; BIO-MOLECULAR; BIOMOLECULAR LAYERS; BIOMOLECULAR RECOGNITION; BIOSENSING DEVICES; COATED SURFACE; DATA ANALYSIS; EXPERIMENTAL DATA; FERRITIN MOLECULES; FORCE MICROSCOPY; FUNCTIONALIZED; IMMUNOASSAY SYSTEM; MOLECULAR RESOLUTION; NEW TOOLS; PIXEL POINTS; PROBE-SAMPLE INTERACTIONS; SCANNING PROBE MICROSCOPE; SENSOR SURFACES; SOLID SUPPORTS; TAPPING-MODE ATOMIC FORCE MICROSCOPY; TWO-DIMENSIONAL MAP;

AFFINITY CHROMATOGRAPHY; ANTIBODIES; ANTIGENS; CHROMATOGRAPHIC ANALYSIS; FORCE MEASUREMENT; IMMUNOLOGY; MOLECULAR BIOLOGY; MOLECULAR RECOGNITION; PRECISION ENGINEERING; PROBES; SENSORS; SURFACE TOPOGRAPHY; SURFACES; TWO DIMENSIONAL;

ATOMIC FORCE MICROSCOPY;

EID: 0000856931     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051141     Document Type: Article

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