Silicon Nanocrystal Flash Memory

Silicon Nanocrystals: Fundamentals, Synthesis and Applications

Volumn , Issue , 2010, Pages 395-444

  Oda, Shunri ^a   Huang, Shaoyun ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

CMOS; Coulomb blockade effect; Erasing speed; Nc Si flash memory; Single electron memory; Tunneling oxide film

Indexed keywords

EID: 84876117208     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527629954.ch15     Document Type: Chapter

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