Fabrication and room-temperature characterization of a silicon self-assembled quantum-dot transistor

Applied Physics Letters

Volumn 73, Issue 21, 1998, Pages 3129-3131

  Choi, B H ^a   Hwang, S W ^a   Kim, I G ^b   Shin, H C ^b   Kim, Yong ^c   Kim, E K ^c  

^a Korea University   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2542490432     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122695     Document Type: Article

References (15)

1. L. Guo, E. Leobandung, and S. Y. Chou, Science 275, 649 (1997).
2. Y. Takahashi, M. Nagase, H. Namatsu, K. Kurihara, K. Iwdate, Y. Nakajima, S. Horiguchi, K. Murase, and M. Tabe, Electron. Lett. 31, 136 (1995).
3. A. Nakajima, T. Futatsugi, K. Kosemura, T. Fukano, and N. Yokoyama, Appl. Phys. Lett. 71, 353 (1997).
4. H. Ishikuro and T. Hiramoto, Appl. Phys. Lett. 71, 3691 (1997).
5. L. Zhuang, L. Guo, and S. Y. Chou, Appl. Phys. Lett. 72, 1205 (1998);
6. E. Leobandung, L. Guo, Y. Wang, and S. Y. Chou, J. Vac. Sci. Technol. B 13, 2865 (1995).
7. K. Matsumoto, M. Ishii, K. Segawa, Y. Oka, B. J. Vartanian, and J. S. Hariss, Appl. Phys. Lett. 68, 34 (1996).
8. J. Shirakashi, K. Matsumoto, N. Miua, and M. Konagai, Appl. Phys. Lett. 72, 1893 (1998).
9. S. Tiwari, F. Rana, H. Hanafi, A. Harstein, E. F. Crabbe, and K. Chan, Appl. Phys. Lett. 68, 1377 (1996).
10. A. Nakajima, Y. Sugita, K. Kawamura, H. Tomita, and N. Yokoyama, Jpn. J. Appl. Phys., Part 2 35, L189 (1996).
11. M. Fukuda, K. Nakagawa, S. Miyazaki, and M. Hirose, Appl. Phys. Lett. 70, 2291 (1997).
12. I. K. Kim, H. Kim, J. Lee, and H. C. Shin, Extended Abstracts of SSDM 98' (1998), p. 170.
13. T. Sakamoto, S. W. Hwang, F. Nihey, Y. Nakamura, and K. Nakamura, Jpn. J. Appl. Phys., Part 1 33, 4876 (1994).
14. W. Chen and H. Ahmed, J. Vac. Sci. Technol. B 13, 2883 (1995).
15. C. Wasshuber, H. Kosina, and S. Selberherr, IEEE Trans. Comput.-Aided Des. 16, 937 (1997).