Fabrication, assembly, and characterization of molecular electronic components

Proceedings of the IEEE

Volumn 91, Issue 11, 2003, Pages 1785-1802

  Mantooth, Brent A ^a   Weiss, Paul S ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Break junctions; Mercury drop junctions; Molecular conductance; Molecular electronics; Nanopores; Nanorods; Scanningprobe microscopy; Self assembledmonolayers (SAMs); Single molecule measurements

Indexed keywords

ASSEMBLY; ELECTRODES; MICROSCOPIC EXAMINATION; MONOLAYERS; NANOSTRUCTURED MATERIALS; PERTURBATION TECHNIQUES; SELF ASSEMBLY;

BREAK JUNCTIONS; MERCURY DROP JUNCTIONS; MOLECULAR CONDUCTANCE; MOLECULAR ELECTRONICS; NANOPORES; NANORODS; SCANNING PROBE MICROSCOPY; SELF-ASSEMBLED MONOLAYERS (SAM); SINGLE-MOLECULE MEASUREMENTS;

ELECTRONIC EQUIPMENT;

EID: 10644297509     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPROC.2003.818320     Document Type: Conference Paper

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