On the go with SONOS

IEEE Circuits and Devices Magazine

Volumn 16, Issue 4, 2000, Pages 22-31

  White, Marvin H ^a   Adams, Dennis A ^b   Bu, Jiankang ^c  

^a LEHIGH UNIVERSITY   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; ELECTRIC INSULATORS; GATES (TRANSISTOR); MOSFET DEVICES; NONVOLATILE STORAGE; RADIATION HARDENING; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SILICA; SILICON NITRIDE;

NONVOLATILE SEMICONDUCTOR MEMORIES (NVSM); SILICON-OXIDE-NITRIDE-SILICON (SONOS) TECHNOLOGY;

SEMICONDUCTOR STORAGE;

EID: 0034224349     PISSN: 87553996     EISSN: None     Source Type: Journal    
DOI: 10.1109/101.857747     Document Type: Article

References (18)

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