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Mauger, P.E.1
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Mauger, P.E.1
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Maldonado, J.1
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110
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11744306695
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note
-
For example, the Leica model, IPRO, is specified to measure to an accuracy of 12 nm, 3σ and repeatability of 5 nm, 3 σ while the Nikon XY6I is quoted as measuring to an accuracy of 7 nm, 3 σ and repeatability of 3 nm, 3 σ.
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112
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For a review of ion induced deposition see J. Melngailis, Proc. SPIE 1465, 36 (1991).
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Melngailis, J.1
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AT&T Bell Labs (private communication)
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L. R. Harriott, AT&T Bell Labs (private communication).
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11744249268
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Radiance Services Co., Bethesda, MD.
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11744267052
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private communication
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In machines where the mask is mounted horizontally the sag due to gravity may need to be considered. From the data of mask deflection vs gas pressure applied to one side, a technique used by Nanostructures to measure the stress in the membrane [P. E. Mauger and A. Shimkunas, Nanostructures (private communication)] we calculate that the sag due to gravity in a membrane with 7 MPa stress is about 2,4 μm.
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Nanostructures
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Mauger, P.E.1
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W. Chu, A. Yen, K. Ismail, M. I. Shepard, H. Lezex, C. R. Musil, J. Melngailis, Y. C. Ku, J. M. Carter, and H. I. Smith, J. Vac. Sci. Technol. B 21 7, 1583 (1989).
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11744314388
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Monte Carlo simulations done by Ernst Hammel Ionen Mikrofabrikations Systeme, Vienna, Austria
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Monte Carlo simulations done by Ernst Hammel Ionen Mikrofabrikations Systeme, Vienna, Austria.
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J. L. Bartlelt, C. W. Slayman, J. E. Wood, J. Y. Chen, C. M. McKenna, C. P. Minning, J. F. Coakley, R. E. Holman, and C. M. Perrygo, J. Vac. Sci. Technol. 19, 1166 (1981).
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Bartlelt, J.L.1
Slayman, C.W.2
Wood, J.E.3
Chen, J.Y.4
McKenna, C.M.5
Minning, C.P.6
Coakley, J.F.7
Holman, R.E.8
Perrygo, C.M.9
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