Measurement of semiconductor local carrier concentration from displacement current-voltage curves with a scanning vibrating probe

Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 3, 2000, Pages 1971-1977

  Majima, Yutaka ^a   Oyama, Yutaka ^a   Iwamoto, Mitsumasa ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000837334     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.62.1971     Document Type: Article

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