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Volumn 92, Issue 1, 2002, Pages 261-267

Materials issues for layered tunnel barrier structures

Author keywords

[No Author keywords available]

Indexed keywords

ARCHIVAL DATA; BAND OFFSETS; CANDIDATE MATERIALS; FOWLER-NORDHEIM TUNNELING; I - V CURVE; NONVOLATILE FLOATING-GATE MEMORY DEVICES; PROGRAM/ERASE; SILICON ELECTRONICS; TUNNEL BARRIER; TUNNEL BARRIER MATERIALS;

EID: 0036639637     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1479747     Document Type: Article
Times cited : (86)

References (27)
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  • 26
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    • S. Zhang, R. Xiao, J. Appl. Phys. 83, 3842 (1998). jap JAPIAU 0021-8979
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    • Zhang, S.1    Xiao, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.