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Volumn 35, Issue 5 PART 1, 1999, Pages 2814-2819

Progress and outlook for mram technology

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETORESISTANCE; RANDOM ACCESS STORAGE; SEMICONDUCTOR STORAGE; THERMODYNAMIC STABILITY;

EID: 0033183994     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.800991     Document Type: Article
Times cited : (404)

References (19)
  • 4
    • 0011998660 scopus 로고    scopus 로고
    • Magnetoresistance of ion-beam deposited Co/Cu/Co and NiFe/Co/Cu/Co/NiFe spin valves,"
    • vol. 85, pp. 4451-53, 1999.
    • J. M. Slaughter, E. Y. Chen, and S. Tehrani Magnetoresistance of ion-beam deposited Co/Cu/Co and NiFe/Co/Cu/Co/NiFe spin valves," J. Appl. Phys., vol. 85, pp. 4451-53, 1999.
    • J. Appl. Phys.
    • Slaughter, J.M.1    Chen, E.Y.2    Tehrani, S.3
  • 9
    • 0001643761 scopus 로고    scopus 로고
    • Submicron Spin Valve Magnetoresistive Random Access Memory Cell"
    • vol. 81, p. 3992, 1997.
    • E. Y. Chen, S. Tehrani, T. Zhu, M. Durlam, and H. Goronkin Submicron Spin Valve Magnetoresistive Random Access Memory Cell" J. Appl. Phys., vol. 81, p. 3992, 1997.
    • J. Appl. Phys.
    • Chen, E.Y.1    Tehrani, S.2    Zhu, T.3    Durlam, M.4    Goronkin, H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.