SCOPUS 정보 검색 플랫폼

Advanced Materials

Volumn 24, Issue 42, 2012, Pages 5655-5675

Advanced electron microscopy for advanced materials

(5) Van Tendeloo, Gustaaf a Bals, Sara a Van Aert, Sandra a Verbeeck, Jo a Van Dyck, Dirk a

a UNIVERSITY OF ANTWERP (Belgium)

Author keywords

electron microscopy; nanomaterials

Indexed keywords

ATOMS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; INTERFACE STATES; NANOSTRUCTURED MATERIALS;

ADVANCED MATERIALS; ANALYTICAL TOOL; ATOMIC COLUMNS; ATOMIC RESOLUTION; ATOMIC SCALE; TWO DIMENSIONS (2D); ULTRA-SMALL; VALENCE STATE;

ELECTRONS;

EID: 84868382777 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.201202107 Document Type: Review

Times cited : (131)

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