Nanoscale tomography in materials science

Materials Today

Volumn 10, Issue 12, 2007, Pages 18-25

  Möbus, Günter ^a   Inkson, Beverley J ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

NUMERICAL METHODS; THREE DIMENSIONAL; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

BEAM MICROSCOPE; MECHANICAL SECTIONING; STRUCTURAL TOOLS;

MICROSTRUCTURE;

EID: 36048995637     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(07)70304-8     Document Type: Review

References (81)

1. Frank J. Electron Tomography: Three-dimensional Imaging with the Transmission Electron Microscope. 2nd ed. (2007), Plenum Press, New York
2. Russ J.C., and Dehoff R.T. Practical Stereology (2000), Plenum Press, New York
3. Cerezo A., et al. Materials Today 10 12 (2007) 36
4. Sorby H. J. Iron Steel Inst. 1 (1887) 255
5. McDowall A.W., et al. J. Microsc. 131 (1983) 1
6. Bron C., et al. Proc. SPIE 1245 (1990) 61
7. Li M., et al. Mater. Characterization 41 (1996) 81
8. Martinez S.J., and Pinoli J.-C. J. Comput.-Assisted Microsc. 8 (1996) 131
9. Alkemper J., and Voorhees P.W. J. Microsc. 201 (2001) 388
10. Orloff J., et al. High resolution Focused Ion Beams: FIB and its Applications (2003), Kluwer, New York
11. Uchic M.D., et al. MRS Bull. 32 (2007) 408
12. Sakamoto T., et al. Jpn. J. Appl. Phys., Part 1 37 4 suppl. A (1998) 2051
13. Tomiyasu B., et al. Nucl. Instrum. Methods Phys. Res., Sect. B 136-138 (1998) 1028
14. Dunn D.N., and Hull R. Appl. Phys. Lett. 75 (1999) 3414
15. Inkson B.J., et al. J. Microsc. 201 (2001) 256
16. Inkson B.J., et al. Scripta Mater. 45 (2001) 753
17. Holzer L., et al. J. Microsc. 216 (2004) 84
18. Kremer J.R., et al. J. Struct. Biol. 116 (1996) 71
19. Amira, Mercury computer systems, Inc., USA, www.tgs.com
20. IDL, Interactive Data Language, ITT Corp., USA, www.ittvis.com/idl
21. Steer T.J., et al. Thin Solid Films 413 (2002) 147
22. Uchic M.D., et al. Scripta Mater. 55 (2006) 23
23. Wu H.Z., et al. Acta Mater. 51 (2003) 149
24. Motoyashiki Y., et al. Fatigue Fracture Eng. Mater. Struct. 30 (2007) 556
25. Holzer L., et al. J. Am. Ceram. Soc. 89 (2006) 2577
26. Münch B., et al. J. Am. Ceram. Soc. 89 (2006) 2586
27. Inkson B.J., et al. Inst. Phys. Conf. Ser. 180 (2003) 611
28. Yeoh, T. S., et al. Mater. Res. Soc. Symp. Proc. (2006) 908E, 0908-OO05-11.1
29. Kotula P.G., et al. Microsc. Microanal. 12 (2006) 36
30. Schaffer M., et al. Ultramicroscopy 107 (2007) 587
31. Groeber M.A., et al. Mater. Characterization 57 (2006) 259
32. de Rosier D.J., and Klug A. Nature 217 (1968) 130
33. Hoppe W., et al. Naturwissenschaften 55 (1968) 333
34. Cormack A.M. J. Appl. Phys. 34 (1963) 2722
35. Haddad W.S., et al. Science 266 (1994) 1213
36. Baruchel J., et al. Scripta Mater. 55 (2006) 41
37. Levine Z.H. Proc. SPIE 5674 (2005) 1
38. Hunt E.M., and Herd C.R. Microsc. Microanal. 7 suppl. 2 (2001) 82
39. Spontak R.J., et al. Macromolecules 29 (1996) 2850
40. Koster A.J., et al. J. Phys. Chem. B 104 (2000) 9368
41. Möbus G., and Inkson B.J. Appl. Phys. Lett. 79 (2001) 1369
42. Möbus G., et al. Ultramicroscopy 96 (2003) 433
43. Midgley P.A., et al. Chem. Commun. (2001) 907
44. Midgley P.A., and Weyland M. Ultramicroscopy 96 (2003) 413
45. Koguchi M., et al. J. Electron Microsc. 50 (2001) 235
46. Weyland M., and Midgley P.A. Materials Today 7 12 (2004) 32
47. Möbus G., and Inkson B.J. Microsc. Microanal. 9 suppl. 2 (2003) 176
48. Xu X., et al. Nanotechnology 18 (2007) 225501
49. Friedrich H., et al. Ultramicroscopy 106 (2005) 18
50. Cervera Gontard L., et al. J. Phys., Conf. Ser. 26 (2006) 203
51. Möbus G., et al. Microsc. Microanal. 10 suppl. 2 (2004) 1196
52. Sakellariou A., et al. Materials Today 10 12 (2007) 44
53. Wikander K., et al. J. Colloid Interface Sci. 305 (2007) 204
54. Ziese U., and Koster A.J. Appl. Catal. A 260 (2004) 71
55. Xu, X. J., et al. Mater. Res. Soc. Symp. Proc. (2007) 928E, 0982-KK02-04
56. Yang, G., et al. Mater. Res. Soc. Symp. Proc. (2007) 985, 0985-NN06-01
57. Stegmann H., et al. Microelectron. Eng. 65 (2002) 171
58. Kübel C., et al. Microsc. Microanal. 11 (2005) 378
59. Park J.-B., et al. Appl. Phys. Lett. 90 (2007) 093111
60. Oikawa T., et al. Microsc. Microanal. 12 suppl. 2 (2006) 616
61. Arbiol, J., et al. Mater. Res. Soc. Symp. Proc. (2004) 818, M.4.5
62. Xu X., et al. J. Phys. Conf. Ser. 61 (2007) 810
63. Barnard J.S., et al. J. Phys. Conf. Ser. 26 (2006) 247
64. Baldock C., et al. J. Struct. Biol. 138 (2002) 130
65. Miller M.K. J. Microsc. 186 (1997) 1
66. McPhail D.S. Appl. Secondary Ion Mass Spectrom. Mater. Sci. 41 (2006) 873
67. Zaitsev, V. S., et al. Mater. Res. Soc. Symp. Proc. (2000) 661, K.K.6.2
68. Hutter H., et al. Fresenius J. Anal. Chem. 346 (1993) 66
69. Nicolas, G., et al. J. Anal. Atomic Spectrom. (2007), doi: 10.1039/b704682k
70. Magerle R. Phys. Rev. Lett. 85 (2000) 2749
71. Dietz C., et al. Rev. Sci. Instrum. 78 (2007) 053703
72. Efimov A.E., et al. J. Microsc. 226 (2007) 207
73. Möbus G. Proc. EUREM 12 1 (2000) 385
74. Möbus G., et al. Inst. Phys. Conf. Ser. 168 (2001) 27
75. Möbus G., and Nufer S. Inst. Phys. Conf. Ser. 168 (2001) 151
76. Möbus G., and Nufer S. Ultramicroscopy 96 (2003) 285
77. Einspahr J.J., and Voyles P.M. Ultramicroscopy 106 (2006) 1041
78. Lupini A.R., et al. Inst. Phys. Conf. Ser. 180 (2003) 523
79. Van Benthem K., et al. Appl. Phys. Lett. 87 (2005) 034104
80. th Int. Microsc. Congr. 2 (2006) 949
81. Nellist P.D., et al. Appl. Phys. Lett. 89 (2006) 124105