Enhanced compositional contrast in imaging of nanoprecipitates buried in a defective crystal using a conventional TEM

Microscopy and Microanalysis

Volumn 9, Issue 1, 2003, Pages 36-41

  Kaiser, Ute ^a   Chuvilin, Andrey ^b  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b BORESKOV INSTITUTE OF CATALYSIS   (Russian Federation)

Author keywords

Annular dark field detector; Conventional TEM; Diffraction contrast; Nanoprecipitates

Indexed keywords

INORGANIC COMPOUND; SILICON CARBIDE; SILICON DERIVATIVE;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRON MICROSCOPY; IMAGE PROCESSING; METHODOLOGY; NANOTECHNOLOGY; PRECIPITATION;

CARBON COMPOUNDS, INORGANIC; CRYSTALLIZATION; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON; NANOTECHNOLOGY; PRECIPITATION; SILICON COMPOUNDS;

EID: 0037291244     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192760303006X     Document Type: Article

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