-
1
-
-
77950535246
-
Chemical solution deposited lanthanum zirconium oxide thin films: Synthesis and chemistry
-
Chen H, Kumar R and Glowacki B 2010 Chemical solution deposited lanthanum zirconium oxide thin films: synthesis and chemistry Mater. Chem. Phys. 122 305-10
-
(2010)
Mater. Chem. Phys.
, vol.122
, Issue.1
, pp. 305-310
-
-
Chen, H.1
Kumar, R.2
Glowacki, B.3
-
2
-
-
4043093699
-
Chemical solution deposition: A path towards low-cost coated conductors
-
Obradors X et al 2004 Chemical solution deposition: a path towards low-cost coated conductors Supercond. Sci. Technol. 17 1055-64
-
(2004)
Supercond. Sci. Technol.
, vol.17
, Issue.8
, pp. 1055-1064
-
-
Obradors, X.1
-
3
-
-
34548664870
-
7-x coated conductors
-
DOI 10.1016/j.cossms.2007.07.001, PII S1359028607000344
-
7 - δ coated conductors Curr. Opin. Solid State Mater. Sci. 10 205-16 (Pubitemid 47411679)
-
(2006)
Current Opinion in Solid State and Materials Science
, vol.10
, Issue.5-6
, pp. 205-216
-
-
Knoth, K.1
Engel, S.2
Apetrii, C.3
Falter, M.4
Schlobach, B.5
Huhne, R.6
Oswald, S.7
Schultz, L.8
Holzapfel, B.9
-
4
-
-
33750597521
-
7 buffer layers for YBCO-coated conductors: Film growth and microstructure
-
DOI 10.1088/0953-2048/19/11/019, PII S0953204806289413, 019
-
7 buffer layers for YBCO-coated conductors: film growth and microstructure Supercond. Sci. Technol. 19 1200-8 (Pubitemid 44679549)
-
(2006)
Superconductor Science and Technology
, vol.19
, Issue.11
, pp. 1200-1208
-
-
Molina, L.1
Knoth, K.2
Engel, S.3
Holzapfel, B.4
Eibl, O.5
-
6
-
-
44449122180
-
7 single buffer layer for YBCO RABiTS coated conductors
-
7 single buffer layer for YBCO RABiTS coated conductors Supercond. Sci. Technol. 21 075007
-
(2008)
Supercond. Sci. Technol.
, vol.21
, Issue.7
, pp. 075007
-
-
Caroff, T.1
Morlens, S.2
Abrutis, A.3
Decroux, M.4
Chaudouet, P.5
Porcar, L.6
Saltyte, Z.7
Jimenez, C.8
Odier, P.9
Weiss, F.10
-
7
-
-
77953812157
-
7 film by chemical solution deposition
-
7 film by chemical solution deposition J. Sol-Gel Sci. Technol. 54 363-70
-
(2010)
J. Sol-Gel Sci. Technol.
, vol.54
, Issue.3
, pp. 363-370
-
-
Yu, Z.1
-
11
-
-
66149128814
-
3 by metalorganic decomposition
-
3 by metalorganic decomposition J. Cryst. Growth 311 3204-10
-
(2009)
J. Cryst. Growth
, vol.311
, Issue.11
, pp. 3204-3210
-
-
Jiménez, C.1
Caroff, T.2
Rapenne, L.3
Morlens, S.4
Santos, E.5
Odier, P.6
Weiss, F.7
-
13
-
-
63449123793
-
3D imaging of nanomaterials by discrete tomography
-
Batenburg K, Bals S, Sijbers J, Kübel C, Midgley P, Hernandez J, Kaiser U, Encina E, Coronado E and Van Tendeloo G 2009 3D imaging of nanomaterials by discrete tomography Ultramicroscopy 109 730-40
-
(2009)
Ultramicroscopy
, vol.109
, Issue.6
, pp. 730-740
-
-
Batenburg, K.1
Bals, S.2
Sijbers, J.3
Kübel, C.4
Midgley, P.5
Hernandez, J.6
Kaiser, U.7
Encina, E.8
Coronado, E.9
Van Tendeloo, G.10
-
14
-
-
38049125216
-
Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes
-
Bals S, Batenburg K J, Verbeeck J, Sijbers J and Van Tendeloo G 2007 Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes Nano Lett. 7 3669-74
-
(2007)
Nano Lett.
, vol.7
, Issue.12
, pp. 3669-3674
-
-
Bals, S.1
Batenburg, K.J.2
Verbeeck, J.3
Sijbers, J.4
Van Tendeloo, G.5
-
15
-
-
0036542209
-
2(001) reaction front during vapour-solid reaction
-
2(001) reaction front during vapour-solid reaction Phil. Mag. Lett. 82 167
-
(2002)
Phil. Mag. Lett.
, vol.82
, Issue.4
, pp. 167
-
-
Lu, C.J.1
Senz, S.2
Hesse, D.3
-
16
-
-
4644259301
-
Model based quantification of EELS spectra
-
Verbeeck J and Van Aert S 2004 Model based quantification of EELS spectra Ultramicroscopy 101 207-23
-
(2004)
Ultramicroscopy
, vol.101
, Issue.2-4
, pp. 207-223
-
-
Verbeeck, J.1
Van Aert, S.2
-
17
-
-
58549109406
-
5.2 anion-deficient layered perovskite
-
5.2 anion-deficient layered perovskite J. Solid State Chem. 182 356-63
-
(2009)
J. Solid State Chem.
, vol.182
, Issue.2
, pp. 356-363
-
-
D'Hondt, H.1
-
19
-
-
33744947843
-
Dielectric and optical properties of nanometric nickel silicides from valence electrons energy-loss spectroscopy experiments
-
DOI 10.1016/j.micron.2006.01.009, PII S0968432806000138
-
Cheynet M and Pantel R 2006 Dielectric and optical properties of nanometric nickel silicides from valence electrons energy-loss spectroscopy experiments Micron 37 377-84 (Pubitemid 43850298)
-
(2006)
Micron
, vol.37
, Issue.5
, pp. 377-384
-
-
Cheynet, M.C.1
Pantel, R.2
-
20
-
-
74549118378
-
Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods
-
Cloet V, Thersleff T, Stadel O, Hoste S, Holzapfel B and Van Driessche I 2010 Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods Acta Mater. 58 1489-94
-
(2010)
Acta Mater.
, vol.58
, Issue.5
, pp. 1489-1494
-
-
Cloet, V.1
Thersleff, T.2
Stadel, O.3
Hoste, S.4
Holzapfel, B.5
Van Driessche, I.6
-
21
-
-
34548172701
-
YBCO coated conductors prepared by chemical solution deposition: A TEM study
-
DOI 10.1016/j.physc.2007.04.115, PII S0921453407006442
-
Molina L, Eibl O, Knoth K, Engel S, Huehne R and Holzapfel B 2007 YBCO coated conductors prepared by chemical solution deposition: a TEM study Physica C 460-462 1407-8 (Pubitemid 47314161)
-
(2007)
Physica C: Superconductivity and its Applications
, vol.460-462 II
, Issue.SPEC. ISS.
, pp. 1407-1408
-
-
Molina, L.1
Eibl, O.2
Knoth, K.3
Engel, S.4
Huhne, R.5
Holzapfel, B.6
-
24
-
-
77955514908
-
Elemental mapping at the atomic scale using low accelerating voltages
-
Botton G A, Lazar S and Dwyer C 2010 Elemental mapping at the atomic scale using low accelerating voltages Ultramicroscopy 110 926-34
-
(2010)
Ultramicroscopy
, vol.110
, Issue.8
, pp. 926-934
-
-
Botton, G.A.1
Lazar, S.2
Dwyer, C.3
-
25
-
-
77952546029
-
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts
-
Ke X, Bals S, Cott D, Hantschel T, Bender H and Van Tendeloo G 2010 Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts Microsc. Microanal. 16 210-7
-
(2010)
Microsc. Microanal.
, vol.16
, Issue.2
, pp. 210-217
-
-
Ke, X.1
Bals, S.2
Cott, D.3
Hantschel, T.4
Bender, H.5
Van Tendeloo, G.6
-
27
-
-
54949102839
-
Progress in nanoengineered microstructures for tunable high-current, high-temperature superconducting wires
-
Holesinger T G et al 2008 Progress in nanoengineered microstructures for tunable high-current, high-temperature superconducting wires Adv. Mater. 20 391-407
-
(2008)
Adv. Mater.
, vol.20
, Issue.3
, pp. 391-407
-
-
Holesinger, T.G.1
-
31
-
-
38649111035
-
7-x coated conductors
-
DOI 10.1016/j.tsf.2007.08.130, PII S0040609007015507
-
7 - x coated conductors Thin Solid Films 516 2099-108 (Pubitemid 351174239)
-
(2008)
Thin Solid Films
, vol.516
, Issue.8
, pp. 2099-2108
-
-
Knoth, K.1
Huhne, R.2
Oswald, S.3
Molina, L.4
Eibl, O.5
Schultz, L.6
Holzapfel, B.7
-
32
-
-
78650104179
-
Measuring porosity at the nanoscale by quantitative electron tomography
-
Biermans E, Molina L, Batenburg K J, Bals S and Van Tendeloo G 2010 Measuring porosity at the nanoscale by quantitative electron tomography Nano Lett. 10 5014-9
-
(2010)
Nano Lett.
, vol.10
, Issue.12
, pp. 5014-5019
-
-
Biermans, E.1
Molina, L.2
Batenburg, K.J.3
Bals, S.4
Van Tendeloo, G.5
-
33
-
-
65349087396
-
7 thin layers on LaAlO3 obtained by chemical methods
-
7 thin layers on LaAlO3 obtained by chemical methods Mater. Res. 24 1480
-
(2009)
Mater. Res.
, vol.24
, Issue.4
, pp. 1480
-
-
Rapenne, L.1
Jimenez, C.2
Caroff, T.3
Millon, C.4
Bayle-Guillemau, P.5
Morlen, S.6
Weis, F.7
-
34
-
-
1542328994
-
Measuring the absolute position of EELS ionisation edges in a TEM
-
DOI 10.1016/S0304-3991(03)00185-2, PII S0304399103001852
-
Potapov P and Schryvers D 2004 Measuring the absolute position of EELS ionisation edges in a TEM Ultramicroscopy 99 73-85 (Pubitemid 38326676)
-
(2004)
Ultramicroscopy
, vol.99
, Issue.1
, pp. 73-85
-
-
Potapov, P.L.1
Schryvers, D.2
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