Atomic-scale study of electric dipoles near charged and uncharged domain walls in ferroelectric films

Nature Materials

Volumn 7, Issue 1, 2008, Pages 57-61

  Jia, Chun Lin ^a   Mi, Shao Bo ^a   Urban, Knut ^a   Vrejoiu, Ionela ^b   Alexe, Marin ^b   Hesse, Dietrich ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC FILMS; FERROELECTRICITY; MICROELECTRONICS; POLARIZATION;

CHARGED IONS; CRYSTAL UNIT CELLS; ELECTRIC POLARIZATION; MICROELECTRONIC APPLICATIONS;

ELECTRIC DIPOLE MOMENTS;

EID: 37649023519     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat2080     Document Type: Article

References (38)

1. Setter, N. & Waser, R. Electroceramic materials. Acta Mater. 48, 151-178 (2000).
2. Dawber, M., Rabe, K. M. & Scott, J. F. Physics of thin-film ferroelectric oxides. Rev. Mod. Phys. 77, 1083-1130 (2005).
3. Scott, J. F. Applications of modern ferroelectrics. Science 315, 954-959 (2007).
4. Roelofs, A. et al. Depolarizing-field-mediated 180 degrees switchingin ferroelectric thin films with 90 degrees domains. Appl. Phys. Lett. 80, 1424 (2001).
5. Jung, D. J., Dawber, M., Scott, J. F., Sinnamon, L. J. & Gregg, J. M. Switching dynamics in ferroelectric thin films: An experimental survey. Integrat. Ferroelectr. 48, 59-68 (2002).
6. Gysel, R., Stolichnov, I., Setter, N. & Pavius, M. Ferroelectric film switching via oblique domain growth observed by cross-sectional nanoscale imaging. Appl. Phys. Lett. 89, 082906 (2006).
7. 3 thin films. Phil. Mag. A 71, 713-724 (1995).
8. 3 thin films prepared by metalorganic chemical vapor deposition: Systematic compositional variation of electronic and optical properties. J. Appl. Phys. 81, 2349-2357 (1997).
9. 3 thin films. J. Appl. Phys. 90, 4095-4102 (2001).
10. 3 thin films. Phys. Rev. Lett. 89, 67601-67604 (2002).
11. Fong, D. D. et al. Ferroelectricity in ultrathin perovskite films. Science 304, 1650-1653 (2004).
12. Foeth, M., Sfera, A., Stadelmann, P. & Buffat, P.-A. A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls. J. Electron Microsc. 48, 717-723 (1999).
13. 3: Fingerprints in XRPD diagrams and quantitative HRTEM image analysis. J. Physique III 7, 1105-1128 (1997).
14. Tanaka, M. & Honjo, G. Electron optical studies of barium titanate single crystal films. J. Phys. Soc. Japan 19, 954-970 (1964).
15. 3 in an electron microscopic image. Acta Cryst. A 31, 59-63 (1975).
16. Gevers, R., Blank, H. & Amelinckx, S. Extension of the Howie-Whelan equations for electron diffraction to non-centro symmetrical crystals. Phys. Status Solidi 13, 449-465 (1966).
17. Serneels, R. et al. Friedel's law in electron diffraction as applied to the study of doman structures in non-centrosymmetrical crystals. Phys. Status Solidi B 58, 277-292 (1973).
18. Wicks, B. J. & Lewis, M. H. Direct observations of ferroelectric domains in lithium niobate. Phys. Status Solidi 26, 571-576 (1968).
19. Bursill, L. A. & Lin, P. J. Electron microscopic studies of ferroelectric crystals. Ferroelectric 70, 191-203 (1986).
20. Sanchez, A. M., Ruterana, P., Benamara, M. & Strunk, H. P. Inversion domains and pinholes in GaN grown over Si(111). Appl. Phys. Lett. 82, 4471-4473 (2003).
21. Liu, Y. Z. et al. Inversion domain boundary in a ZnO film. Phil. Mag. Lett. 87, 687-693 (2007).
22. 3 crystals. Appl. Phys. Lett. 90, 192906 (2007).
23. Jia, C. L., Lentzen, M. & Urban, K. Atomic-resolution imaging of oxygen in perovskite ceramics. Science 299, 870-873 (2003).
24. Jia, C. L. & Urban, K. Atomic-resolution measurement of oxygen concentration in oxide materials. Science 303, 2001-2004 (2004).
25. Haider, M. et al. Electron microscopy image enhanced. Nature 392, 768-769 (1998).
26. Jia, C. L., Lentzen, M. & Urban, K. High-resolution transmission electron microscopy using negative spherical aberration. Microsc. Microanal. 10, 174-184 (2004).
27. 3 obtained on layer-by-layer grown, defect-free single-crystalline films. Adv. Mater. 18, 1657-1661 (2006).
28. Wu, X. & Vanderbilt, D. Theory of hypothetical ferroelectric superlattices incorporating head-to-head and tail-to-tail 180° domain walls. Phys. Rev. B 73, 020103 (2006).
29. 7-δ by aberration corrected HRTEM. Ultramicroscopy 106, 200-214 (2006).
30. Williams, D. B. & Carter, C. B. Transmission Electron Microscopy (Plenum, New York and London, 1996).
31. Zhong, W., King-Smith, R. D. & Vanderbilt, D. Giant LO-TO splittings in perovskite ferroelectrics. Phys. Rev. Lett. 72, 3618-3621 (1994).
32. 3. Appl. Phys. Lett. 75, 2830-2832 (1999).
33. 3. Phys. Rev. B 65, 104111 (2002).
34. Catalan, G., Scott, J. F., Schilling, A. & Gregg, J. M. Wall thickness dependence of the scaling law for ferroic stripe domains. J. Phys. Condens. Matter 19, 02201 (2007).
35. Miller, R. C. & Weinreich, G. Mechanism for the sidewise motion of 180-degrees domain walls in barium titanate. Phys. Rev. 117, 1460-1466 (1960).
36. Hayashi, M. Kinetics of domain wall motion in ferroelectric switching. 1. General formulation. J. Phys. Soc. Japan 33, 616 (1972).
37. Gopalan, V., Dierolf, V. & Scrymgeour, D. A. Defect-domain wall interactions in trigonal ferroelectrics. Annu. Rev. Mater. Res. 37, 449-89 (2007).
38. O'Keefe, M. A. & Kilaas, R. Advances in high-resolution image simulation. Scan Microsc. Suppl. 2, 225-244 (1988).