Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: A practical example

Ultramicroscopy

Volumn 104, Issue 2, 2005, Pages 107-125

  Van Aert, S ^a   Den Dekker, A J ^b   Van Den Bos, A ^c   Van Dyck, D ^a   Chen, J H ^c  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Data processing; Electron microscope design and characterization; General methods in microscopy; High resolution transmission electron microscopy (HRTEM); Image processing; Tools

Indexed keywords

ALUMINUM; CRYSTALS; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; PARAMETER ESTIMATION;

ALUMINUM CRYSTALS; ATOM COLUMN DISTANCES; ELECTRON MICROSCOPY IMAGES; STRUCTURE PARAMETERS;

MAXIMUM LIKELIHOOD ESTIMATION;

ALUMINUM;

ARTICLE; CONFIDENCE INTERVAL; CRYSTAL STRUCTURE; DISTANCE PERCEPTION; EXPERIMENTATION; IMAGE PROCESSING; IMAGE QUALITY; MAXIMUM LIKELIHOOD METHOD; PARAMETERS OF MEASUREMENT AND ANALYSIS; THEORETICAL MODEL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 20544451969     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.03.002     Document Type: Article

References (6)

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