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Advanced Materials

Volumn 18, Issue 7, 2006, Pages 892-895

A new approach for electron tomography: Annular dark-field transmission electron microscopy

(3) Bals, Sara a Van Tendeloo, Gustaaf a Kisielowski, Christian b

a UNIVERSITY OF ANTWERP (Belgium)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33845363910 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/adma.200502201 Document Type: Article

Times cited : (63)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.