Electron tomography based on a total variation minimization reconstruction technique

Ultramicroscopy

Volumn 113, Issue , 2012, Pages 120-130

  Goris, B ^a   Van den Broek, W ^a   Batenburg, K J ^a,b   Heidari Mezerji, H ^a   Bals, S ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b CWI   (Netherlands)

Author keywords

Compressive sensing; Electron tomography; Reconstruction algorithm; Total variation minimization

Indexed keywords

3D RECONSTRUCTION; BACK-PROJECTION; COMPRESSIVE SENSING; DATA SETS; ELECTRON TOMOGRAPHY; ILL POSED; ITERATIVE ALGORITHM; NANO SCALE; RECONSTRUCTED OBJECTS; RECONSTRUCTION ALGORITHM; RECONSTRUCTION ALGORITHMS; RECONSTRUCTION TECHNIQUES; SIMULTANEOUS ITERATIVE RECONSTRUCTION TECHNIQUES; SPARSE SOLUTIONS; TOTAL VARIATION MINIMIZATION;

ALGORITHMS; ELECTRIC IMPEDANCE TOMOGRAPHY; IMAGE PROCESSING; ITERATIVE METHODS; SIGNAL RECONSTRUCTION;

THREE DIMENSIONAL;

CADMIUM; LEAD; NANOPARTICLE; SILICON; SILVER;

ALGORITHM; ARTICLE; ARTIFACT; ELECTRON TOMOGRAPHY; IMAGE PROCESSING; IMAGE RECONSTRUCTION; NANOIMAGING; PHANTOM; SIMULATION;

EID: 84855774069     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.11.004     Document Type: Article

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