A new approach for 3D reconstruction from bright field TEM imaging: Beam precession assisted electron tomography

Ultramicroscopy

Volumn 111, Issue 9-10, 2011, Pages 1504-1511

  Rebled, J M ^a,c   Yedra, L ^a   Estrade S ^a,b   Portillo, J ^a,b   Peiro F ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

^b TEM MAT   (Spain)

^c INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

Defects; Diffraction contrast; Electron beam precession; Electron tomography; Transmission electron microscopy

Indexed keywords

3D RECONSTRUCTION; ALTERNATIVE PROCEDURES; BRIGHT FIELDS; BRIGHT-FIELD TEM IMAGING; CONVENTIONAL TEM; DIFFRACTION CONTRAST; ELECTRON TOMOGRAPHY; HIGH-ANGLE ANNULAR DARK FIELD DETECTORS; MATRIX; NANO-OBJECTS; SCANNING SYSTEMS; THIN FOIL; TRANSMISSION ELECTRON;

DEFECTS; DIFFRACTION; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON BEAMS; ELECTRONS; STRONTIUM COMPOUNDS; TIN; TRANSMISSION ELECTRON MICROSCOPY;

THREE DIMENSIONAL;

ALUMINUM; TIN;

ANALYTICAL PARAMETERS; ARTICLE; ARTIFACT REDUCTION; CHEMICAL STRUCTURE; CONTRAST; DIFFRACTION; ELECTRON BEAM TOMOGRAPHY; IMAGE DISPLAY; IMAGE PROCESSING; IMAGE RECONSTRUCTION; NANOIMAGING; PRECIPITATION; RADIATION DETECTOR; THREE DIMENSIONAL IMAGING; TRANSMISSION ELECTRON MICROSCOPY;

ALGORITHMS; ARTIFACTS; ELECTRON MICROSCOPE TOMOGRAPHY; EQUIPMENT DESIGN; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, TRANSMISSION;

EID: 80052927247     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.06.002     Document Type: Article

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