Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?

Ultramicroscopy

Volumn 98, Issue 1, 2003, Pages 27-42

  Van Dyck, D ^a   Van Aert, S ^b   Den Dekker, A J ^b   Van Den Bos, A ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Amorphous structure; Atomic resolution; Electron tomography; Parameter estimation; Precision; Transmission electron microscopy

Indexed keywords

MICROSCOPIC EXAMINATION; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

SMALL FOIL THICKNESSES;

AMORPHOUS MATERIALS;

ARTICLE; ATOM; ATOMIC RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; FOIL; LIGHT; MICROSCOPE; RECORDING; STRUCTURE ANALYSIS; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0242594690     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00023-8     Document Type: Article

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