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Volumn 645, Issue 1, 2011, Pages 12-19

Monochromators in electron microscopy

Author keywords

Energy resolution; Monochromator; Omega filter; Ray tracing; Simulation; Wien filter

Indexed keywords

ACCELERATING VOLTAGES; BEAM STABILITY; DOUBLE WIEN FILTERS; ENERGY RESOLUTIONS; FRINGE FIELDS; HIGH SPATIAL RESOLUTION; HIGH VOLTAGE; OMEGA FILTER; SIMULATION; VERY HIGH ENERGIES; WIEN FILTERS;

EID: 79958230694     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.12.164     Document Type: Conference Paper
Times cited : (10)

References (35)
  • 20
    • 79958234337 scopus 로고    scopus 로고
    • Aberration theory in Handbook of Charged Particle Optics
    • P.W. Hawkes Aberration theory in Handbook of Charged Particle Optics J. Orlof, Fig 12, line 2009 CRC press 377 379
    • (2009) Fig 12, Line , pp. 377-379
    • Hawkes, P.W.1
  • 22
    • 0035762629 scopus 로고    scopus 로고
    • Charged Particle Detection, Diagnostics and Imaging
    • K. Tsuno Charged Particle Detection, Diagnostics and Imaging O. Delage, E. Munro, J. Rouse, Proc. SPIE vol. 4510 2001 71 79
    • (2001) Proc. SPIE , vol.4510 , pp. 71-79
    • Tsuno, K.1
  • 32


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.