-
10
-
-
0036409165
-
-
P.C. Tiemeijer, J.H.A. Van Lin, B.H. Freitag, and A.F. De Jong Microsc. Microanal. 8 Suppl 2 2002 70
-
(2002)
Microsc. Microanal.
, vol.8
, Issue.SUPPL. 2
, pp. 70
-
-
Tiemeijer, P.C.1
Van Lin, J.H.A.2
Freitag, B.H.3
De Jong, A.F.4
-
11
-
-
18644366383
-
-
M. Tanaka, M. Terauchi, K. Tsuda, K. Saitoh, M. Mukai, T. Kaneyama, T. Tomita, K. Tsuno, M. Kersker, Naruse, and T. Honda Microsc. Microanal. 8 Suppl. 2 2002 68
-
(2002)
Microsc. Microanal.
, vol.8
, Issue.SUPPL. 2
, pp. 68
-
-
Tanaka, M.1
Terauchi, M.2
Tsuda, K.3
Saitoh, K.4
Mukai, M.5
Kaneyama, T.6
Tomita, T.7
Tsuno, K.8
Kersker, M.9
Naruse10
Honda, T.11
-
13
-
-
0033351981
-
-
A. Huber, E. Plies, SPIE, Conference on Charged Particle Optics IV, 1999, vol. 3777, pp. 264274.
-
(1999)
SPIE, Conference on Charged Particle Optics IV
, vol.3777
, pp. 264-274
-
-
Huber, A.1
Plies, E.2
-
15
-
-
77955517347
-
-
E. Essers, G. Benner, T. Mandler, S. Meyer, D. Mittmann, M. Schnell, and R. Hoschen Ultramicroscopy 110 2010 971
-
(2010)
Ultramicroscopy
, vol.110
, pp. 971
-
-
Essers, E.1
Benner, G.2
Mandler, T.3
Meyer, S.4
Mittmann, D.5
Schnell, M.6
Hoschen, R.7
-
16
-
-
49549095370
-
-
M. Mukai, W. Inami, K. Omoto, T. Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, Y. Satoh, M. Naruse, T. Honda, and M. Tanaka Microsc. Microanal. 13 Suppl. 2 2007 1242
-
(2007)
Microsc. Microanal.
, vol.13
, Issue.SUPPL. 2
, pp. 1242
-
-
Mukai, M.1
Inami, W.2
Omoto, K.3
Kaneyama, T.4
Tomita, T.5
Tsuno, K.6
Terauchi, M.7
Tsuda, K.8
Satoh, Y.9
Naruse, M.10
Honda, T.11
Tanaka, M.12
-
20
-
-
79958234337
-
Aberration theory in Handbook of Charged Particle Optics
-
P.W. Hawkes Aberration theory in Handbook of Charged Particle Optics J. Orlof, Fig 12, line 2009 CRC press 377 379
-
(2009)
Fig 12, Line
, pp. 377-379
-
-
Hawkes, P.W.1
-
21
-
-
48049105762
-
-
K. Omoto, K. Tsuno, M. Ohsaki, S. Matsumura, and Y. Tomokiyo Micron 39 2008 666
-
(2008)
Micron
, vol.39
, pp. 666
-
-
Omoto, K.1
Tsuno, K.2
Ohsaki, M.3
Matsumura, S.4
Tomokiyo, Y.5
-
22
-
-
0035762629
-
Charged Particle Detection, Diagnostics and Imaging
-
K. Tsuno Charged Particle Detection, Diagnostics and Imaging O. Delage, E. Munro, J. Rouse, Proc. SPIE vol. 4510 2001 71 79
-
(2001)
Proc. SPIE
, vol.4510
, pp. 71-79
-
-
Tsuno, K.1
-
23
-
-
70349414556
-
-
O.L. Krivanek, J.P. Ursin, N.J. Bacon, G.J. Corbin, N. Dellby, P. Hrncirik, M.F. Murfitt, C.S. Own, and Z.S. Szilagyi Phil. Trans. R. Soc. 367 2009 3683
-
(2009)
Phil. Trans. R. Soc.
, vol.367
, pp. 3683
-
-
Krivanek, O.L.1
Ursin, J.P.2
Bacon, N.J.3
Corbin, G.J.4
Dellby, N.5
Hrncirik, P.6
Murfitt, M.F.7
Own, C.S.8
Szilagyi, Z.S.9
-
24
-
-
34547838381
-
-
H. Sawada, F. Hosokawa, T. Kaneyama, T. Ishizawa, M. Terao, M. Kawazoe, T. Sannomiya, T. Tomita, Y. Kondo, T. Tanaka, Y. Oshima, Y. Tanishiro, N. Yamamoto, and K. Takayanagi Jpn. J. Appl. Phys. 46 2007 L568
-
(2007)
Jpn. J. Appl. Phys.
, vol.46
, pp. 568
-
-
Sawada, H.1
Hosokawa, F.2
Kaneyama, T.3
Ishizawa, T.4
Terao, M.5
Kawazoe, M.6
Sannomiya, T.7
Tomita, T.8
Kondo, Y.9
Tanaka, T.10
Oshima, Y.11
Tanishiro, Y.12
Yamamoto, N.13
Takayanagi, K.14
-
25
-
-
48149090714
-
-
E. Rokuta, H.-S. Kuo, T. Itagaki, K. Nomura, T. Ishikawa, B.-L. Cho, I.-S. Hwang, T.T. Tsong, and C. Oshima Surf. Sci. 602 2008 2508
-
(2008)
Surf. Sci.
, vol.602
, pp. 2508
-
-
Rokuta, E.1
Kuo, H.-S.2
Itagaki, T.3
Nomura, K.4
Ishikawa, T.5
Cho, B.-L.6
Hwang, I.-S.7
Tsong, T.T.8
Oshima, C.9
-
26
-
-
56249114815
-
-
X. Jin, Y. Maeda, T. Saka, M. Tanioku, S. Fuchi, T. Ujihara, Y. Takeda, N. Yamamoto, Y. Nakagawa, A. Mano, S. Okumi, M. Yamamoto, T. Nakanishi, H. Horinaka, T. Kato, T. Yasue, and T. Koshikawa J. Cryst. Growth 310 2008 5039
-
(2008)
J. Cryst. Growth
, vol.310
, pp. 5039
-
-
Jin, X.1
Maeda, Y.2
Saka, T.3
Tanioku, M.4
Fuchi, S.5
Ujihara, T.6
Takeda, Y.7
Yamamoto, N.8
Nakagawa, Y.9
Mano, A.10
Okumi, S.11
Yamamoto, M.12
Nakanishi, T.13
Horinaka, H.14
Kato, T.15
Yasue, T.16
Koshikawa, T.17
-
32
-
-
0022776821
-
-
T.T. Tang Optik 74 1986 51
-
(1986)
Optik
, vol.74
, pp. 51
-
-
Tang, T.T.1
-
34
-
-
79958216480
-
-
U. S. Patent 5,838,011
-
M.P.C.M. Krijin, A. Henstra, K.D. Van Den Mast, U. S. Patent 5,838,011, 1988.
-
(1988)
-
-
Krijin, M.P.C.M.1
Henstra, A.2
Mast Den Van, K.D.3
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