Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy

Ultramicroscopy

Volumn 109, Issue 10, 2009, Pages 1236-1244

  Van Aert, S ^a   Verbeeck, J ^a   Erni, R ^b   Bals, S ^a   Luysberg, M ^c   Dyck, D Van ^a   Tendeloo, G Van ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Compositional mapping; High angle annular dark field scanning transmission electron microscopy (HAADF STEM); Statistical parameter estimation theory

Indexed keywords

ACCURACY AND PRECISION; ATOMIC COLUMNS; ATOMIC NUMBERS; ATOMIC RESOLUTION; CHEMICAL COMPOSITIONS; COMPOSITIONAL MAPPING; ELECTRON ENERGY LOSS SPECTRUM; ELECTRON ENERGY-LOSS SPECTRA; ESTIMATION THEORY; HAADF-STEM; HIGH ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY (HAADF STEM); HIGH-ANGLE ANNULAR DARK FIELDS; IMAGE CONTRASTS; INTENSITY PROFILES; MODEL-BASED METHOD; PERFORMANCE MEASURE; QUANTITATIVE MAPPING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCATTERED ELECTRONS; SCATTERED INTENSITY; STATISTICAL HYPOTHESIS TESTING; STATISTICAL PARAMETER ESTIMATION THEORY; STATISTICAL PARAMETERS;

ATOMIC SPECTROSCOPY; ATOMS; DISSOCIATION; ELECTRIC FIELD MEASUREMENT; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPES; ELECTRONS; ENERGY DISSIPATION; LIGHT TRANSMISSION; MAPPING; METAL ANALYSIS; PARAMETER ESTIMATION; SCANNING; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS; TESTING;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

ACCURACY; ARTICLE; CHEMICAL COMPOSITION; CONTROLLED STUDY; ELECTRON MICROSCOPY; HIGH ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; QUANTITATIVE ANALYSIS; RELIABILITY; SENSITIVITY AND SPECIFICITY; SIMULATION; STATISTICAL ANALYSIS;

EID: 68549128524     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.05.010     Document Type: Article

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