Image contrast in aberration-corrected scanning confocal electron microscopy

Advances in Imaging and Electron Physics

Volumn 162, Issue C, 2010, Pages 45-76

  Cosgriff, E C ^a   Nellist, P D ^a   D'Alfonso, A J ^b   Findlay, S D ^c   Behan, G ^a,d   Wang, P ^a   Allen, L J ^b   Kirkland, A I ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c UNIVERSITY OF TOKYO   (Japan)

^d TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; WAVE FUNCTIONS;

ABERRATION-CORRECTED; BLOCH WAVE THEORY; CONFOCAL OPTICAL MICROSCOPIES; CONTRAST VARIATION; DOUBLE INTEGRALS; IMAGE FORMATION MECHANISMS; TRANSMISSION FUNCTION; WEAK PHASE OBJECT;

SCANNING ELECTRON MICROSCOPY;

EID: 77954188678     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(10)62002-2     Document Type: Article

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