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Applied Physics Letters

Volumn 95, Issue 19, 2009, Pages

Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

(7) Findlay, S D a Shibata, N a,b Sawada, H c Okunishi, E c Kondo, Y c Yamamoto, T a,d Ikuhara, Y a,d,e

a UNIVERSITY OF TOKYO (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

c JEOL LTD (Japan)

d JAPAN FINE CERAMICS CENTER (Japan)

e TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNULAR DETECTORS; ATOMIC-RESOLUTION IMAGING; BRIGHT FIELDS; DIRECT IMAGING; HEAVY ATOMS; HIGH-ANGLE ANNULAR DARK-FIELD IMAGING; LIGHT ELEMENTS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMPLE PHYSICAL MODELS; SYSTEMATIC SIMULATION;

CHEMICAL ELEMENTS; ELECTRIC FIELD MEASUREMENT; SCANNING ELECTRON MICROSCOPY; SIMULATORS; TRANSMISSION ELECTRON MICROSCOPY;

LIGHT TRANSMISSION;

EID: 70449719176 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3265946 Document Type: Article

Times cited : (316)

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