Development of a 200kV atomic resolution analytical electron microscope

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 188-189

  Ishikawa, Isamu ^a   Okunishi, Eiji ^a   Sawada, Hidetaka ^a   Okura, Yoshihiro ^a   Yamazaki, Kazuya ^a   Ishikawa, Takaki ^a   Kawazu, Motoharu ^a   Hori, Madoka ^a   Terao, Mitsuhisa ^a   Kanno, Masahiko ^a   Tanba, Shinichi ^a   Kondo, Yukihito ^a  

^a JEOL LTD   (Japan)

Author keywords

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Indexed keywords

EID: 69949119350     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609093829     Document Type: Article

References (3)

1. D.A. Muller et al., Science 319, 1073 (2008)
2. A.R. Lupini and S.J. Pennycook, Ultramicroscopy 96, 313 (2003)
3. M. Varela et al, Phys. Rev. Lett. 92, 095502 (2004)