Quantitative atomic 3-D imaging of single/double sheet graphene structure

Carbon

Volumn 49, Issue 2, 2011, Pages 556-562

  Jinschek, Joerg R ^a   Yucelen, Emrah ^a,b   Calderon, Hector A ^c   Freitag, Bert ^a  

^a Thermo Fisher Scientific   (United States)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

3D IMAGING; ACCELERATION VOLTAGES; ATOMIC ARRANGEMENT; ATOMIC STRUCTURE; BASE STRUCTURE; CARBON ATOMS; CARBON NANOSTRUCTURES; DETECTION SENSITIVITY; GRAPHENE SHEETS; IMAGE SIMULATIONS; LAYER STRUCTURES; SINGLE-CARBON ATOMS;

DAMAGE DETECTION; GRAPHENE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; THREE DIMENSIONAL;

ATOMS;

EID: 78650024863     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2010.09.058     Document Type: Article

References (24)

1. A.K. Geim Graphene: status and prospects Science 324 5934 2009 1530 1534
2. K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, Y. Zhang, and S.V. Dubonos Electric field effect in atomically thin carbon films Science 306 5696 2004 666 669
3. K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, M.I. Katsnelson, and I.V. Grigorieva Two-dimensional gas of massless Dirac fermions in graphene Nature 438 4233 2005 197 200
4. A.H. Castro Neto, F. Guinea, N.M.R. Peres, K.S. Novoselov, and A.K. Geim The electronic properties of graphene Rev Modern Phys 81 1 2009 109 162
5. Y.-M. Lin, C. Dimitrakopoulos, K.A. Jenkins, D.B. Farmer, H.-Y. Chiu, and A. Grill 100-GHz Transistors from wafer-scale epitaxial graphene Science 347 5966 2010 662
6. M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban Electron microscopy image enhanced Nature 392 1998 768 769
7. M. Haider, H. Müller, S. Uhlemann, J. Zach, U. Loebau, and R. Hoeschen Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM Ultramicrosopy 108 3 2008 167 178
8. S. Iijima, and T. Ichihashi Single-shell carbon nanotubes of 1-nm diameter Nature 363 1993 603 605
9. B.W. Smith, M. Monthioux, and D.E. Luzzi Encapsulated C60 in carbon nanotubes Nature 396 1998 323 324
10. R. Erni, B. Freitag, P. Hartel, H. Müller, P. Tiemeijer, and M. van der Stam Atomic scale analysis of planar defects in polycrystalline diamond Microsc Microanal 12 6 2006 492 497
11. R.R. Meyer, J. Sloan, R.E. Dunin-Borkowski, A.I. Kirkland, M.C. Novotny, and S.R. Bailey Discrete atom imaging of one-dimensional crystals formed within single-walled carbon nanotubes Science 289 5483 2000 1324 1327
12. J.C. Meyer, C. Kisielowski, R. Erni, M.D. Rossell, M.F. Crommie, and A. Zettl Direct imaging of lattice atoms and topological defects in graphene membranes Nano Lett 8 11 2008 3582 3586
13. C.O. Girit, J.C. Meyer, R. Erni, M.D. Rossell, C. Kisielowski, and L. Yang Graphene at the edge: stability and dynamics Science 323 5922 2009 1705 1708
14. J.R. Jinschek, K.J. Batenburg, H.A. Calderon, R. Kilaas, V. Radmilovic, and C. Kisielowski 3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: prospects of atomic resolution electron tomography Ultramicroscopy 108 6 2008 589 604
15. J. Sloan, A.I. Kirkland, J.L. Hutchison, and M.L. Green Structural characterization of atomically regulated nanocrystals formed within single-walled carbon nanotubes using electron microscopy Acc Chem Res 35 12 2002 1054 1062
16. J.R. Jinschek, C. Kisielowski, D. Van Dyck, and P. Geuens Measurement of the Indium segregation in InGaN based LEDs with single atom sensitivity I.T. Ferguson, N. Narendran, S.P. DenBaars, J.C. Carrano, Proceedings of SPIE 2004 SPIE Bellingham, WA 54 63
17. L. Cervera Gontard, L.-Y. Chang, C.J.D. Hetherington, A.I. Kirkland, D. Ozkaya, and R.E. Dunin-Borkowski Aberration-corrected imaging of active sites on industrial catalyst nanoparticles Angew Chem Int Ed 46 20 2007 3683 3685
18. A. Zobelli, A. Gloter, C.P. Ewels, G. Seifert, and C. Colliex Electron knock-on cross section of carbon and boron nitride nanotubes Phys Rev B 75 24 2007 245402
19. L. Reimer, and H. Kohl Transmission electron microscopy: physics of image formation 5th ed. 2005 Springer Science New York
20. B. Freitag, S. Kujawa, P.M. Mul, J. Ringnalda, and P.C. Tiemeijer Breaking the spherical and chromatic aberration barrier in transmission electron microscopy Ultramicroscopy 102 3 2005 209 214
21. J. Barthel, and A. Thust Quantification of the information limit of transmission electron microscopes Phys Rev Lett 101 20 2008 200801
22. W. Coene, A. Thust, M. Op de Beeck, and D. Van Dyck Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy Ultramicroscopy 64 1-4 1996 109 135
23. P. Bevington, and D.K. Robinson Data reduction and error analysis for the physical sciences 2002 McGraw-Hill New York
24. A. Thust, M.H.F. Overwijk, W. Coene, and M. Lentzen Numerical correction of lens aberrations in phase-retrieval HRTEM Ultramicroscopy 64 1-4 1996 249 264