Elemental mapping in scanning transmission electron microscopy

Journal of Physics: Conference Series

Volumn 241, Issue , 2010, Pages

  Allen, L J ^a   D'Alfonso, J D ^a   Findlay, S D ^b   Lebeau, J M ^c   Lugg, N R ^a   Stemmer, S ^c  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b UNIVERSITY OF TOKYO   (Japan)

^c University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPY; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IONIZATION POTENTIAL; MAPPING; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

COMPLEMENTARY TECHNIQUES; ENERGY DISPERSIVE X-RAY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; FIRST-PRINCIPLES CALCULATION; HIGH ANGLE ANNULAR DARK FIELD IMAGING (HAADF); IMAGING CONDITIONS; INTENSITY VARIATIONS; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 78651104976     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/241/1/012061     Document Type: Conference Paper

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