Why some interfaces cannot be sharp

Nature Materials

Volumn 5, Issue 3, 2006, Pages 204-209

  Nakagawa, Naoyuki ^a,b   Hwang, Harold Y ^a,b   Muller, David A ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; CHARGE CARRIERS; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; INTERFACIAL ENERGY; IONS; LANTHANUM COMPOUNDS; SPECTROSCOPIC ANALYSIS;

ATOMIC DIMENSIONS; ATOMIC SCALE ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRICAL ASYMMETRY; MICROSCOPIC DISTRIBUTION;

INTERFACES (MATERIALS);

EID: 33644625568     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat1569     Document Type: Article

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