New 300 kV energy-filtering field emission electron microscope

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 40, Issue 11 A, 2001, Pages

  Bando, Yoshio ^a   Mitome, Masanori ^a   Golberg, Dmitri ^a   Kitami, Yoshizo ^a   Kurashima, Keiji ^a   Kaneyama, Toshihiko ^b   Okura, Yoshihiro ^b   Naruse, Mikio ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JEOL LTD   (Japan)

Author keywords

300 kV omega; Elemental images; Energy filter; High resolution energy filtered image

Indexed keywords

ALUMINUM COMPOUNDS; ATOMIC PHYSICS; ATOMS; CRYSTALLINE MATERIALS; FIELD EMISSION MICROSCOPES; IMAGE ANALYSIS; NUMERICAL ANALYSIS; OXYGEN; TRANSMISSION ELECTRON MICROSCOPY;

ELEMENTAL IMAGES; ENERGY FILTERING FIELD EMISSION ELECTRON MICROSCOPE; INELASTIC ELECTRONS; OXYGEN ATOMS; PERIODIC SEPARATION;

ELECTRON MICROSCOPES;

EID: 0035517811     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.l1193     Document Type: Letter

References (13)