A new way of producing electron vortex probes for STEM

Ultramicroscopy

Volumn 113, Issue , 2012, Pages 83-87

  Verbeeck, J ^a   Tian, H ^a   Beche A ^a,b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b Thermo Fisher Scientific   (United States)

Author keywords

Angular momentum; Electron vortex; Holographic reconstruction; STEM; Topological charge

Indexed keywords

ATOMIC RESOLUTION; BACKGROUND SIGNALS; DIFFERENT HEIGHTS; ELECTRON VORTEX; HAADF-STEM; HOLOGRAPHIC RECONSTRUCTION; SCANNING TRANSMISSION ELECTRON MICROSCOPES; STEM; TOPOLOGICAL CHARGES; WORKING PRINCIPLES;

ANGULAR MOMENTUM; ELECTRON ENERGY LOSS SPECTROSCOPY; TOPOLOGY;

PROBES;

ARTICLE; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON PROBE MICROANALYSIS; HOLOGRAPHY; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION;

EID: 84855756652     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.10.008     Document Type: Article

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