Image simulation of high resolution energy filtered TEM images

Ultramicroscopy

Volumn 109, Issue 4, 2009, Pages 350-360

  Verbeeck, Jo ^a   Schattschneider, Peter ^b   Rosenauer, Andreas ^c  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^c UNIVERSITY OF BREMEN   (Germany)

Author keywords

Coherence; EELS; EFTEM; Image simulation; Inelastic scattering

Indexed keywords

A DENSITIES; ACCELERATION VOLTAGES; COHERENCE; DEFOCUS; EDGE ENERGIES; EELS; EFTEM; ENERGY FILTERED TEM; EXIT PLANES; FUNDAMENTAL LIMITS; HIGH RESOLUTIONS; HIGH-RESOLUTION TEM; IMAGE SIMULATION; INTERPRETABILITY; MULTI-LAYER SYSTEMS; TEM;

COMPUTATIONAL FLUID DYNAMICS; COMPUTER SOFTWARE; INELASTIC SCATTERING; STRONTIUM ALLOYS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 61849128858     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.01.003     Document Type: Article

References (40)

1. Van Dyck D., Lichte H., and Spence J.C.H. Ultramicroscopy 81 (2000) 187-194
2. H. Rose, private communications.
3. Yoshioka H. J. Phys. Soc. Jpn. 12 (1957) 618-628
4. Rose H. Ultramicroscopy 15 (1984) 173-192
5. Kohl H., and Rose H. Adv. Electron. Electron. Phys. 65 (1985) 173
6. H. Müller, A coherence function approach to image simulation, Ph.D. Thesis Technical University Darmstadt, 2000.
7. P. Schorsch, Simulation energiegefilterter elektronenmikroskopischer Bilder unter Berücksichtigung inelastischer Streuprozesse, Ph.D. Thesis Technical University Darmstadt, 2001.
8. Allen L.J., Findlay S.D., Oxley M.P., Witte C., and Zaluzec N.J. Ultramicroscopy 106 (2006) 1001-1011
9. Oxley M.P., Varela M., Pennycook T.J., van Benthem K., Findlay S.D., D'Alfonso A.J., Allen L.J., and Pennycook S.J. Phys. Rev. B 76 (2007) 064303
10. Findlay S.D., Allen L.J., Oxley M.P., and Rossouw C.J. Ultramicroscopy 96 (2003) 65-81
11. Rossouw C.J., Allen L.J., Findlay S.D., and Oxley M.P. Ultramicroscopy 96 (2003) 299-312
12. Findlay S.D., Oxley M.P., Pennycook S.J., and Allen L.J. Ultramicroscopy 104 (2005) 126-140
13. Allen L.J., and Rossouw C.J. Phys. Rev. B 47 5 (1993) 2446-2452
14. Oxley M.P., and Allen L.J. Ultramicroscopy 80 (1999) 125-131
15. Findlay S.D., Schattschneider P., and Allen L.J. Ultramicroscopy 108 1 (2007) 58-67
16. D'Alfonso A.J., Findlay S.D., Oxley M.P., and Allen L.J. Ultramicroscopy 108 (2008) 677-687
17. Allen L.J., Findlay S.D., Oxley M.P., and Rossouw C.J. Ultramicroscopy 96 (2003) 47-63
18. Dwyer C. Ultramicroscopy 104 (2005) 141
19. Dwyer C., and Barnard J.S. Phys. Rev. B 74 (2006) 064106
20. Dwyer C., Findlay S.D., and Allen L.J. Phys. Rev. B 77 (2008) 184107
21. Berger A., and Kohl H. Microsc. Microanal. Microstruct. 3 (1992) 159-174
22. Navidi-Kasmai T., and Kohl H. Ultramicroscopy 81 (2000) 223-233
23. Stallknecht P., and Kohl H. Ultramicroscopy 66 (1996) 261-275
24. Schenner M., Nelhiebel M., and Schattschneider P. Diffraction effects in electron spectroscopic imaging. Ultramicroscopy 65 (1996) 95-99
25. Nelhiebel M., Schenner M., and Schattschneider P. Interference effects in inelastic thickness fringes. Ultramicroscopy 66 (1996) 173-181
26. Dudarev S.L., Peng L.-M., and Whelan M.J. Phys. Rev. B 48 18 (1993) 13408-13429
27. Schattschneider P., Nelhiebel M., and Jouffrey B. Phys. Rev. B 59 16 (1999) 10959-10969
28. A. Rosenauer, M. Schowalter, in: Springer Proceedings in Physics: Microscopy of Semiconducting Materials (MSM) Conference 2007, Cambridge.
29. A. Rosenauer, M. Schowalter, J.T. Titantah, D. Lamoen, Ultramicroscopy, 108 (12) (2008) 1504-1513.
30. Egerton R.F. Ultramicroscopy 107 8 (2007) 575-586
31. P. Schattschneider, J. Verbeeck, V. Mauchamp, M. Jaouen, Energy filtered imaging of chiral electronic transitions, Ultramicroscopy (2008), in preparation.
32. P. Schattschneider, J. Verbeeck, A.L. Hamon, Mapping chiral electronic transitions, Ultramicroscopy (2008), submitted for publication.
33. Bertoni G., and Verbeeck J. Ultramicroscopy 108 (2008) 782-790
34. Maslen V.W., and Rossouw C.J. Philos. Mag. A 47 1 (1983) 119-130
35. Ohtomo A., and Wang H.Y. Nature 427 (2004) 423-426
36. Müller D.A., Kourkoutis L.F., Murfitt M., Song J.H., Hwang H.Y., Silcox J., Dellby N., and Krivanek O.L. Science 319 (2008) 1073-1075
37. P. Blaha, K. Schwarz, G. Madsen, D. Kvasicka, J. Luitz, WIEN2k, An augmented plane wave+local orbital program for calculating crystal properties, Karlheinz Schwarz, Techn. Universität Wien, Austria, 2001.
38. Ankudinov A.L., Ravel B., Rehr J.J., and Conradson S.D. Phys. Rev. B 58 (1998) 7565
39. Freitag B., and Mader W. J. Microsc. 194 (1999) 42-57
40. Kainuma Y. The theory of Kikuchi patterns. Acta Cryst. 8 (1955) 247-257