Mapping titanium and tin oxide phases using EELS: An application of independent component analysis

Ultramicroscopy

Volumn 111, Issue 2, 2011, Pages 169-176

  de la Pena F ^a   Berger, M H ^b   Hochepied, J F ^b   Dynys, F ^c   Stephan, O ^a   Walls, M ^a  

^a UNIVERSITÉ PARIS SUD   (France)

^b PSL RESEARCH UNIVERSITY   (France)

^c NASA GLENN RESEARCH CENTER   (United States)

Author keywords

Blind separation of sources; Electron energy loss spectroscopy (EELS); Independent component analysis; Multivariate statistical analysis; Quantification; SnO2; Spinodal decomposition; TiO2

Indexed keywords

BLIND SEPARATION; ELECTRON ENERGY-LOSS SPECTROSCOPY (EELS); INDEPENDENT COMPONENTS; MULTIVARIATE STATISTICAL ANALYSIS; QUANTIFICATION; SNO2; SPINODALS; TIO;

BLIND SOURCE SEPARATION; DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; MAPPING; MULTIVARIANT ANALYSIS; SILICON COMPOUNDS; SPINODAL DECOMPOSITION; TIN; TIN OXIDES; TITANIUM; TITANIUM OXIDES;

INDEPENDENT COMPONENT ANALYSIS;

TIN OXIDE; TITANIUM DIOXIDE;

ACCURACY; ARTICLE; CHEMICAL COMPOSITION; CONTROLLED STUDY; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE QUALITY; INDEPENDENT COMPONENT ANALYSIS; INTERMETHOD COMPARISON; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; NANOANALYSIS; PRINCIPAL COMPONENT ANALYSIS; QUANTITATIVE ANALYSIS; SIGNAL NOISE RATIO; SYSTEMATIC ERROR;

MULTIVARIATE ANALYSIS; OXIDES; SPECTROSCOPY, ELECTRON ENERGY-LOSS; TIN COMPOUNDS; TITANIUM;

EID: 78649800446     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.10.001     Document Type: Article

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