High-resolution transmission electron microscopy on an absolute contrast scale

Physical Review Letters

Volumn 102, Issue 22, 2009, Pages

  Thust, A ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE CONTRASTS; IMAGE SIMULATIONS; QUANTITATIVE APPROACH;

ELECTRON MICROSCOPES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 66649099587     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.102.220801     Document Type: Article

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