Prospects for reliable 3D imaging in aberration-corrected STEM, TEM and SCEM

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 1474-1475

  Xin, Huolin L ^a   Muller, David A ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949139434     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609095622     Document Type: Article

References (9)

1. H. L. Xin, V. Intaraprasonk, and D. A. Muller, Applied Physics Letters 92, 013125 (2008).
2. R. F. Loane, and J. Silcox, Proceedings of the 47th Annual Meeting of EMSA, 124 (1989).
3. H. L. Xin, V. Intaraprasonk, and D. A. Muller, Microscopy and Microanalysis 14, 926 (2008).
4. P. D. Nellist et al., Microscopy and Microanalysis 14, 104 (2008).
5. M. Takeguchi et al., J Electron Microsc (Tokyo) 57, 123 (2008).
6. V. Intaraprasonk, H. L. Xin, and D. A. Muller, Ultramicroscopy 108, 1454 (2008).
7. H. L. Xin, and D. A. Muller, J Electron Microsc (Tokyo), doi:10.1093/jmicro/dfn029 (2009).
8. J. K. Hyun, P. Ercius, and D. A. Muller, Ultramicroscopy 109, 1 (2008).
9. Research supported by Semiconductor Research Corporation and NSF MRSEC DMR# 0520404.