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Volumn 104, Issue 40, 2000, Pages 9368-9370
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Three-dimensional transmission electron microscopy: a novel imaging and characterization technique with nanometer scale resolution for materials science
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALS;
GRAIN SIZE AND SHAPE;
IMAGE ANALYSIS;
IMAGE RECONSTRUCTION;
SILVER;
SODIUM COMPOUNDS;
THREE DIMENSIONAL;
ZEOLITES;
ACID LEACHED MORDENITE;
METAL ZEOLITE CRYSTAL;
NANOMETER SCALE RESOLUTION;
VIRTUAL CROSS SECTIONS;
VIRTUAL RENDERING;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 0034299393
PISSN: 10895647
EISSN: None
Source Type: Journal
DOI: 10.1021/jp0015628 Document Type: Article |
Times cited : (252)
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References (21)
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