Incoherent bright field stem for imaging and tomography of ultra-thick tem cross-sections

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 238-239

  Ercius, P ^a   Muller, D A ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949186330     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609098067     Document Type: Article

References (4)

1. P. Ercius, et al., Applied Physics Letters, 88, (2006) 243116.
2. L. Pages, et al, Atomic Data 4 (1972) 1-27.
3. E.J. Kirkland, et al., Ultramicroscopy 23 (1987) 77.
4. Funding and support provided by the Semiconductor Research Corporation and Cornell Center for Materials Research.