Refinement procedure for the image alignment in high-resolution electron tomography

Ultramicroscopy

Volumn 111, Issue 9-10, 2011, Pages 1512-1520

  Houben, L ^a   Bar Sadan, M ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Electron tomography; High resolution tomography; Marker free alignment

Indexed keywords

CROSS-CORRELATION ANALYSIS; ELECTRON TOMOGRAPHY; HIGH RESOLUTION; HIGH-RESOLUTION ELECTRON TOMOGRAPHY; HIGH-RESOLUTION TOMOGRAPHY; IMAGE ALIGNMENT; LOWER RESOLUTION; OPTIMISATIONS; SEARCH ALGORITHMS; SUBPIXEL ACCURACY; TILT ANGLE; TRANSMISSION ELECTRON MICROSCOPY IMAGES; ULTRAHIGH RESOLUTION;

ALIGNMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRONS; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

ACCURACY; ALGORITHM; ARTICLE; CONTRAST; CORRELATION ANALYSIS; ELECTRON MICROSCOPY; ELECTRON TOMOGRAPHY; IMAGE DISPLAY; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RECONSTRUCTION; NANOIMAGING; SIMULATION;

ALGORITHMS; COMPUTER SIMULATION; ELECTRON MICROSCOPE TOMOGRAPHY; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, THEORETICAL; SOFTWARE; TOMOGRAPHY, X-RAY COMPUTED;

EID: 80052928861     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.06.001     Document Type: Article

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