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Volumn 25, Issue 10, 2010, Pages 1503-1545

Atomic spectrometry update-X-ray fluorescence spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL EQUIPMENT; ANGLE DEPENDENCE; ATOMIC SPECTROMETRY; BULK ANALYSIS; CALIBRATION PROCEDURE; CULTURAL HERITAGE STUDIES; EATING HABITS; EXTRATERRESTRIAL MATERIAL; FLIGHT MEASUREMENTS; FLUORESCENCE SIGNALS; GEOCHEMICAL MAPPING; GREEN ROOF; LABORATORY EQUIPMENTS; MATRIX CORRECTION; MICRO BEAMS; MICROCALORIMETER; PORTABLE XRF; QUANTITATIVE ANALYSIS; RADIATION SOURCE; RESEARCH ACTIVITIES; SAMPLE PREPARATION; SILICON DRIFT DETECTOR; SURFACE SENSITIVITY; THIN LAYERS; THREE DIMENSIONAL IMAGING; WOOD TREATMENT; X RAY FLUORESCENCE SPECTROMETRY; X-RAY DETECTOR;

EID: 77957162838     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/c005501h     Document Type: Review
Times cited : (67)

References (498)
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    • R. Ortega Metallomics 2009 1 2 137 141
    • (2009) Metallomics , vol.1 , Issue.2 , pp. 137-141
    • Ortega, R.1
  • 214
  • 291
    • 67349083525 scopus 로고    scopus 로고
    • L. Samek Microchem. J. 2009 92 2 140 144
    • (2009) Microchem. J. , vol.92 , Issue.2 , pp. 140-144
    • Samek, L.1
  • 465
  • 466
  • 498


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.