Three empirical cases of the deposition morphology influence in the analytical quality of direct solid suspension measurements by total-reflection X-ray fluorescence

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 64, Issue 7, 2009, Pages 672-678

  Fernandez Ruiz R ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

Direct solid analysis; Homogeneity; Nanoparticles; TXRF; Uncertainty

Indexed keywords

ANALYTICAL RESULTS; CARBON NANO PARTICLES; DEPOSITION MORPHOLOGY; DIRECT SOLID ANALYSIS; EVAPORATION PROCESS; HOMOGENEITY; LIQUID MEDIUM; MACROSCOPIC MORPHOLOGY; MAGNETITE NANOPARTICLES; METALLIC CONTENT; MICROSCOPIC MORPHOLOGY; REFERENCE CLAYS; SAMPLE DEPOSITION; SOLID DEPOSITION; SOLID SUSPENSIONS; TXRF; UNCERTAINTY; X RAY FLUORESCENCE;

CLAY MINERALS; FLUORESCENCE; IRON ORES; MORPHOLOGY; NANOPARTICLES; OXIDE MINERALS; TOLUENE; UNCERTAINTY ANALYSIS; WATER ANALYSIS;

SUSPENSIONS (FLUIDS);

EID: 68049112350     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2009.05.028     Document Type: Article

References (23)

1. A. von Bohlen, M. Krämer, C. Sternemann, M. Paulus. The influence of X-ray coherence length on TXRF and XSW and the characterization of nanoparticles observed under grazing incidence of X-rays. J. Anal. At. Spectrom. 24 (2009) 792-800.
2. Klockenkämper R., and von Bohlen A. Determination of critical thickness and the sensitivity for thin film analysis by total reflection X-ray fluorescence spectrometry. Spectrochim. Acta Part B 44 (1989) 461-469
3. Hellin D., Fyen W., Rip J., Delande T., Mertens P.M., De Gendt S., and Vinckier C. Saturation effects in TXRF on micro-droplet residue samples. J. Anal. At. Spectrom. 19 (2004) 1517-1523
4. Fernández-Ruiz R., Furió M., Cabello Galisteo F., Larese C., López Granados M., Mariscal R., and Fierro J.L.G. Chemical analysis of used three way catalysts by total reflection X-ray fluorescence. Anal. Chem. 74 (2002) 5463-5469
5. Fernández-Ruiz R., Cabello Galisteo F., Larese C., López Granados M., Mariscal R., and Fierro J.L.G. TXRF analysis of aged three way catalysts. Analyst 131 (2006) 590-594
6. Fernández-Ruiz R., Tornero J.D., González V.M., and Alonso C. Quantification of Pt bound to DNA using total-reflection X-ray fluorescence (TXRF). Analyst 124 (1999) 583-585
7. González M., Tapia L., Alvarado M., Tornero J.D., and Fernández-Ruiz R. Intracellular determination of trace elements by total-reflection X-ray fluorescence spectrometry in mammalian cultured cells. J. Anal. At. Spectrom. 14 (1999) 885-888
8. 3 by the TXRF technique. J. Anal. At. Spectrom. 16 (2001) 867-869
9. z by total-reflection XRF. Analyst 124 (2001) 583-585
10. Fernández-Ruiz R., and Garcia-Heras M. Study of archaeological ceramics by total-reflection X-ray fluorescence spectrometry: semiquantitative approach. Spectrochim. Acta Part B 62 (2007) 1123-1129
11. Fernández-Ruiz R., and Garcia-Heras M. Analysis of archaeological ceramics by TXRF: quantitative approaches. Spectrochim. Acta Part B 63 (2008) 975-979
12. Fernández-Ruiz R., Costo R., Morales M.P., Bomatí-Miguel O., and Veintemillas-Verdaguer S. Total-reflection X-ray fluorescence: an alternative tool for the analysis of magnetic ferrofluids. Spectrochim. Acta Part B 63 (2008) 1387-1394
13. Fernández-Ruiz R. The uncertainty in the multielemental quantification by TXRF: theoretical and empirical approximation. Anal. Chem. 80 (2008) 8372-8381
14. Mori Y., and Uemura K. Error factors in quantitative total reflection X-ray fluorescence analysis. X-Ray Spectrom. 28 (1999) 421-426
15. Esaka F., Watanabe K., Onodera T., Taguchi T., Magara M., and Usuda S. The use of Si carriers for aerosol particle collection and subsequent elemental analysis by total-reflection X-ray fluorescence spectrometry. Spectrochim. Acta Part B 58 (2003) 2145-2155
16. De Boer D.K.G. X-ray standing waves and the critical sample thickness for total-reflection x-ray fluorescence analysis. Spectrochim. Acta Part B 46 (1991) 1433-1436
17. Theisen M., and Niessner R. Sapphire sample carriers for silicon determination by total-reflection X-ray fluorescence analysis. Spectrochim. Acta Part B 54 (1999) 1839-1848
18. Szaloki I., Utaka T., Tsuji Y., and Taniguchi K. Quantification of TXRF analysis. JCPDS- International Centre for Diffraction Data (1999) 812-821
19. Fittschen U.E.A., Hauschild S., Amberger M.A., Lammel G., Streli C., Foerster S., Wobrauschek P., Jokubonis C., Pepponi G., Falkenberg G., and Broekaert J.A.C. A new technique for the deposition of standard solutions in total reflection X-ray fluorescence spectrometry (TXRF) using pico-droplets generated by inkjet printers and its applicability for aerosol analysis with SR-TXRF. Spectrochim. Acta Part B 61 (2006) 1098-1104
20. Peschel B.U., Fittschen U.E.A., Pepponi G., Jokubonis C., Streli C., Wobrauschek P., Falkenberg G., and Broekaert J.A.C. Direct analysis of Al2O3 powders by total reflection X-ray fluorescence spectrometry. Anal Bioanal Chem 382 (2005) 1958-1964
21. Garcia-Heras M., Blackman M.J., Fernández-Ruiz R., and Bishop R.L. Assessing ceramic compositional data: a comparison of total reflection X-ray fluorescence and instrumental neutron activation analysis on late Iron Age Spanish Celtiberian ceramics. Archaeometry 43 (2001) 325-347
22. Tartaj P., Morales M.d.P., Veintemillas-Verdaguer S., González-Carreño T., and Serna C.J. The preparation of magnetic nanoparticles for applications in biomedicine. J. Phys. D 36 (2003) R182
23. Fernández-Ruiz R., Ocon P., and Manuel Montiel. First approximation to the analysis of Ru and Se in carbon nanoparticles as a new voltaic pile system by TXRF. J. Anal. At. Spectrom. 24 (2009) 785-791