Evaluation of controlled-drift detectors in X-ray spectroscopic imaging applications

Microscopy and Microanalysis

Volumn 15, Issue 3, 2009, Pages 231-236

  Castoldi, Andrea ^a,b   Guazzoni, Chiara ^a,b   Ozkan, Cigdem ^a,c   Vedani, Giorgio ^a   Hartmann, Robert ^d,e   Bjeoumikhov, Aniouar ^f  

^a POLITECNICO DI MILANO   (Italy)

^b INFN SEZIONE DI MILANO   (Italy)

^c UNIVERSITY OF MILAN   (Italy)

^d PNSENSOR GMBH   (Germany)

^e MPI HALBLEITERLABOR   (Germany)

^f IFG GmbH   (Germany)

Author keywords

Absorption contrast; Controlled drift detectors; Diffraction enhanced imaging; Elemental mapping.; Silicon drift detectors; X ray imaging; X ray spectroscopy; XRF

Indexed keywords

EID: 69849083908     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609090291     Document Type: Article

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