Multilayers quantitative X-ray fluorescence analysis applied to easel paintings

Analytical and Bioanalytical Chemistry

Volumn 395, Issue 7, 2009, Pages 2015-2020

  De Viguerie, Laurence ^a   Sole, V Armando ^b   Walter, Philippe ^a  

^a CENTRE DE RECHERCHE ET DE RESTAURATION DES MUSÉES DE FRANCE   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Multilayers; Quantitative analysis; Thickness estimation; Varnish; X Ray fluorescence

Indexed keywords

AVERAGE VALUES; CHARACTERISTIC LINES; ELEMENTAL COMPOSITIONS; FUNDAMENTAL PARAMETERS; IN-SITU; INTENSITY RATIO; LAYERED STRUCTURES; MAXIMUM ERROR; NONDESTRUCTIVE TOOLS; PORTABLE SYSTEM; QUALITATIVE ANALYSIS; QUANTITATIVE ANALYSIS; QUANTITATIVE TREATMENT; TEST SAMPLES; THICKNESS ESTIMATION; WORK FOCUS; X RAY FLUORESCENCE; X RAY FLUORESCENCE ANALYSIS; X RAY FLUORESCENCE SPECTROMETRY; X-RAY ATTENUATION; XRF ANALYSIS;

CHEMICAL ANALYSIS; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; MULTILAYERS; THICKNESS MEASUREMENT; VARNISH; X RAY ANALYSIS; X RAYS;

QUALITY CONTROL;

EID: 71449101464     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-009-2997-0     Document Type: Conference Paper

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