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Volumn 607, Issue 1, 2009, Pages 129-131

Characterization of TlBr for X-ray and γ-ray detector applications

Author keywords

ray detector; TlBr; X ray detector; X ray topography

Indexed keywords

ANGLE BOUNDARIES; BRIDGMAN-STOCKBARGER PROCESS; CRYSTAL QUALITIES; ELECTRICAL CHARACTERIZATION; SMALL-ANGLE GRAIN BOUNDARIES; SPECTROSCOPIC CHARACTERISTICS; SYNCHROTRON X RAYS; TEMPERATURE RANGE; TLBR; X-RAY DETECTOR; X-RAY DIFFRACTION MEASUREMENTS; X-RAY TOPOGRAPHY;

EID: 67650503151     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.03.125     Document Type: Article
Times cited : (7)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.