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Volumn 607, Issue 1, 2009, Pages 129-131
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Characterization of TlBr for X-ray and γ-ray detector applications
b
Bruker Baltic
(Latvia)
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Author keywords
ray detector; TlBr; X ray detector; X ray topography
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Indexed keywords
ANGLE BOUNDARIES;
BRIDGMAN-STOCKBARGER PROCESS;
CRYSTAL QUALITIES;
ELECTRICAL CHARACTERIZATION;
SMALL-ANGLE GRAIN BOUNDARIES;
SPECTROSCOPIC CHARACTERISTICS;
SYNCHROTRON X RAYS;
TEMPERATURE RANGE;
TLBR;
X-RAY DETECTOR;
X-RAY DIFFRACTION MEASUREMENTS;
X-RAY TOPOGRAPHY;
CRYSTALS;
CURRENT VOLTAGE CHARACTERISTICS;
DIFFRACTION;
ELECTRIC POTENTIAL;
GRAIN BOUNDARIES;
RADIATION DETECTORS;
X RAY APPARATUS;
X RAY DIFFRACTION;
X RAYS;
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EID: 67650503151
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2009.03.125 Document Type: Article |
Times cited : (7)
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References (6)
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