Influence of annealing in nitrogen on the structural, electrical, and optical properties of CdO films doped with samarium

Materials Chemistry and Physics

Volumn 117, Issue 1, 2009, Pages 284-287

  Dakhel, A A ^a  

^a UNIVERSITY OF BAHRAIN   (Bahrain)

Author keywords

Degenerate semiconductors; nitridation; Optical properties; Sm doped CdO; TCO

Indexed keywords

CADMIUM OXIDE; CDO FILMS; CRYSTALLINITY; CUBIC CRYSTALLINE; DEGENERATE SEMICONDUCTORS; ELECTRICAL MEASUREMENT; LOW TEMPERATURES; NITROGEN GAS; SI WAFER; SM-DOPED CDO; TCO; TRANSPARENT CONDUCTING OXIDE; X RAY FLUORESCENCE;

ANNEALING; CADMIUM; CADMIUM COMPOUNDS; CARRIER CONCENTRATION; FILM PREPARATION; LOW TEMPERATURE PRODUCTION; NITRIDATION; OPTICAL PROPERTIES; OXIDE FILMS; SAMARIUM; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; VACUUM EVAPORATION;

OPTICAL FILMS;

EID: 67650069249     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2009.06.003     Document Type: Article

References (32)

1. Zhao Z., Morel D.L., and Ferekides C.S. Thin Solid Films 413 (2002) 203
2. Gupta R.K., Ghosh K., Patel R., Mishra S.R., and Kahol P.K. Mater. Lett. 62 (2008) 4103
3. Santos-Cruz J., Torres-Delgado G., Castanedo-Perez R., Zuniga-Romero C.I., and Zelaya-Amgel O. Thin Solid Films 515 (2007) 5381
4. Yu Yang S., Jin J.E., Medvedeva J.R., Ireland A.W., Metz J., Ni M.C., Hersam A.J., Freeman T.J., and Marks. J. Am. Chem. Soc. 127 (2005) 8796
5. Yan M., Lane M., Kannewurf C.R., and Chang R.P.H. Appl. Phys. Lett. 78 (2001) 02342
6. Freeman A.J., Poeppelmeier K.R., Mason T.O., Chang R.P.H., and Marks T.J. Mater. Res. Soc. Bull. 25 (2000) 45
7. Maity R., and Chattopadhyay K.K. Sol. Energy Mater. Sol. Cell 90 (2006) 597
8. Shu S., Yang Y., Medvedova J.E., Ireland J.R., Metz A.W., Ni J., Kannewurf C.R., Freeman A.J., and Tobin T.J. J. Am. Chem. Soc. 126 (2004) 13787
9. Yang Yu., Shu S.J., Medvedeva J.E., Ireland J.R., Metz A.W., Jun N., Hersam M.C., Freeman A.J., and Marks T.J. J. Am. Chem. Soc. 127 (2005) 8796
10. Kenneth Barbalace http://klbprouctions.com/, Periodic Table of Elements-Sorted by Ionic Radius, EnvironmentalChemistry.com.1995-2008. http://EnvironmentalChemistry.com/yogi/periodic/ionicradius.html (accessed on-line: 5/5/2008).
11. Dakhel A.A. J. Alloys Compd. (2008) 10.1016/j.jallcom.2008.08.008
12. Duan X.-Y., Zhao Y.-J., and Yao R.-H. Sol. Stat. Commun. 147 (2008) 194
13. Yuan G.D., Ye Z.Z., Zhu L.P., Qian Q., Zhao B.H., and Fan R.X. Appl. Phys. Lett. 86 (2005) 202106
14. Kim H., Cepler A., Osofsky M.S., Auyeung R.C.Y., and Pique A. Appl. Phys. Lett. 90 (2007) 203508
15. Jaklevic J.M., and Goulding F.S. Energy dispersion. In: Herglotz H.K., and Birks L.S. (Eds). X-ray Spectrometry (1978), M. Dekker, NY P50
16. Powder Diffraction File, Joint Committee for Powder Diffraction Studies (JCPDS) file no. 05-0640.
17. Barrett C.S., and Massalski T.B. Structure of Metals (1980), Oxford, Pergamon p. 204
18. Subramanyam T.K., Uthanna S., and Naidu B.S. Mater. Lett. 35 (1998) 214
19. Reddy K.T.R., Sravani C., and Miles R.W. J. Cryst. Growth 184/185 (1998) 1031
20. Phatak G., and Lai R. Thin Solid Films 209 (1992) 240
21. In: Kaelble E.F. (Ed). Handbook of X-rays for Diffraction, Emission, Absorption, and Microscopy (1967), McGraw-Hill, New York 17-25
22. Hong W.Q. J. Phys. D: Appl. Phys. 22 (1989) 1384
23. Tauc J. In: Abeles F. (Ed). Optical Properties of Solids (1972), North Holland Press, Amsterdam 277
24. Dakhel A.A. J. Alloys Compd. 475 (2009) 51
25. Qiao Z., Agashe C., and Mergel D. Thin Solid Films 496 (2006) 520
26. Fox M. Optical Properties of Solids (2001), Oxford Press p. 156
27. Kawamura K., Maekawa K., Yanagi H., Hirano M., and Hosono H. Thin Solid Films 445 (2003) 182
28. Heavens O.S. Optical properties of thin Solid films (1991), Dover publication, New York
29. Takahashi I., Payne D.J., Palgrave R.G., and Egdell R.G. Chem. Phys. Lett. 454 (2008) 314
30. Burstein E. Phys. Rev. 93 (1954) 632
31. Ghosh P.K., Maity R., and Chattopadhyay K.K. Sol. Energy Mater. Sol. Cell 81 (2004) 279
32. Erat S., Metin H., and Ari M. Mater. Chem. Phys. 111 (2008) 114