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European Physical Journal: Special Topics

Volumn 167, Issue 1, 2009, Pages 33-39

Atomic-scale X-ray structural analysis of self-assembled monolayers on silicon

(8) Lin, J C a Kellar, J A a Kim, J H b Yoder, N L a Bevan, K H c Nguyen, S T b Hersam, M C a,b Bedzyk, M J a

a Northwestern University (United States)

b NORTHWESTERN UNIVERSITY (United States)

c Purdue University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 63749101087 PISSN: 19516355 EISSN: 19516401 Source Type: Journal
DOI: 10.1140/epjst/e2009-00933-8 Document Type: Article

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.