Experimental study and correction of the absorption and enhancement effect between Ti, V and Fe

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis

Volumn 29, Issue 11, 2009, Pages 3158-3162

  Tuo, Xian Guo ^a   Mu, Ke Liang ^a   Li, Zhe ^a   Wang, Hong Hui ^a   Luo, Hui ^a   Yang, Jian Bo ^a  

^a CHENGDU UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

(Bogus)duality system; Absorption and enhancement effect; Correction method; Exponential fitting; XRF

Indexed keywords

(BOGUS)DUALITY SYSTEM; CORRECTION METHOD; COUNT RATES; DEGREE OF ABSORPTION; DUALITY SYSTEMS; ELEMENT CONTENTS; ENHANCEMENT EFFECTS; EXPERIMENTAL STUDIES; EXPONENTIAL FITTING; FITTING METHOD; FUNCTION EQUATIONS; RELATIVE ERRORS; X RAY FLUORESCENCE; X RAY FLUORESCENCE ANALYSIS; XRF;

ELECTROMAGNETIC WAVE ATTENUATION; FLUORESCENCE; FUNCTION EVALUATION; SEMICONDUCTOR DETECTORS; X RAY ANALYSIS;

ABSORPTION;

EID: 70449421523     PISSN: 10000593     EISSN: None     Source Type: Journal    
DOI: 10.3964/j.issn.1000-0593(2009)11-3158-04     Document Type: Article

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